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Method and system for processing signal oscillogram in hardware test report

A technology for hardware testing and test reporting, applied in word processing, electrical digital data processing, natural language data processing, etc., can solve problems such as too many signals to be tested, automatic signal classification, and inability to do batch processing, and achieve automatic The effect of judgment

Inactive Publication Date: 2021-06-08
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Aiming at the defects in the prior art, the present invention provides a method for processing the signal waveform diagram in the hardware test report, aiming to solve the problem that the processing of the signal waveform diagram in the prior art cannot realize the automation of signal classification and for the signal to be tested There are too many cases, and the problem of batch processing cannot be achieved

Method used

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  • Method and system for processing signal oscillogram in hardware test report
  • Method and system for processing signal oscillogram in hardware test report
  • Method and system for processing signal oscillogram in hardware test report

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Embodiment Construction

[0057] Embodiments of the technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solution of the present invention more clearly, and therefore are only examples, and cannot be used to limit the protection scope of the present invention.

[0058] figure 1 It is an implementation flowchart of the processing method of the signal waveform diagram in the hardware test report provided by the present invention, which specifically includes the following steps:

[0059] In step S101, the signal waveform diagram collected by the oscilloscope is automatically imported and inserted into the designated picture storage location corresponding to the test case in the corresponding table in the hardware test report;

[0060] In step S102, after the import of the signal waveform diagram is completed, a logical judgment is made on the signal test result paramet...

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Abstract

The invention relates to the technical field of hardware testing, and provides a method and system for processing a signal oscillogram in a hardware test report, and the method comprises the steps: automatically importing and inserting the signal oscillogram collected by an oscilloscope into a specified picture storage position corresponding to a test case in a corresponding table in the hardware test report; and after the signal oscillogram is imported, carrying out logic judgment on the signal test result parameters in the test report, and outputting a corresponding test conclusion in the pre-configured test conclusion options, so that the signal oscillogram acquired by an oscilloscope is automatically and quickly imported into the test report, and the automatic judgment of the signal quality is achieved, and the time and labor are saved.

Description

technical field [0001] The invention belongs to the technical field of hardware testing, and in particular relates to a processing method and system for a signal waveform diagram in a hardware testing report. Background technique [0002] In the field of engineering, for hardware engineers, hardware testing is essential. While seeing the specific signal waveform, it can also indirectly measure the performance of the board. Usually, for a complete hardware test, there are many signals to be tested, and they are divided into several categories according to the nature of the signals. It is difficult to organize the measured signals into the test report. [0003] At present, the signals to be tested in the test case are tested sequentially through an oscilloscope to obtain signal waveform diagrams, and these images are sequentially imported into the corresponding signal classifications in the test report; Whether the measured result is within the range, it has the following def...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F40/166G06F40/18G01R13/00
CPCG01R13/00G06F40/166G06F40/18
Inventor 刘庆元
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD