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Applications of adaptive microelectronic circuits designed for testability

A microelectronic circuit, adaptive technology, applied in the direction of measuring electricity, measuring electrical variables, detecting faulty computer hardware, etc., can solve problems such as optimization tools that do not give performance optimization or characterization of circuits and circuit components

Pending Publication Date: 2021-06-15
MINIMA PROCESSOR OY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] While the DFT method is good for acceptance testing of fabricated circuits and some run-time monitoring for correct operation of microelectronic systems, its known applications do not give optimization tools for performance optimization or characterization of circuits and circuit components

Method used

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  • Applications of adaptive microelectronic circuits designed for testability
  • Applications of adaptive microelectronic circuits designed for testability
  • Applications of adaptive microelectronic circuits designed for testability

Examples

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Embodiment Construction

[0045] An adaptive microelectronic circuit or system is a device in which the values ​​of operating parameters can be changed in some way during operation to optimize performance. The most important operating parameters are operating voltage and clock speed. The last mentioned is determining the rate at which digital values ​​appearing at the input of a register circuit will be stored and made available at the output of the register circuit.

[0046] In order to minimize the energy consumption of the microelectronic circuit, it is advantageous to have the operating voltage as low as possible. But the operating voltage cannot be made arbitrarily low because lower operating voltages cause slower transitions between states in circuit components, which in turn can cause timing errors and indeterminate states. However, the minimum value of the operating voltage at which satisfactory performance of the microelectronic circuit can be maintained is not necessarily constant, but may v...

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Abstract

The performance of a microelectronic circuit can be configured by making an operating parameter assume an operating parameter value. An operating method comprises selectively setting the microelectronic circuit into a test mode that differs from a normal operating mode of the microelectronic circuit, and utilizing the test mode to input test input signals consisting of test input values into one or more adaptive processing paths within the microelectronic circuit. An adaptive processing path comprises processing logic and register circuits configured to produce output values from the input values input to them. The performance of such adaptive processing path can be configured by making an operating parameter assume an operating parameter value. The method comprises making the one or more adaptive processing paths form the test output values on the basis of the respective test input values input to them, and forming a set of test output signals by collecting the test output values given by the one or more adaptive processing paths. The method comprises examining the set of test output signals, and forming a test result on the basis of the examining, and using the test result to select and set an operating parameter value for the operating parameter.

Description

technical field [0001] The invention applies generally to the technical field of microelectronic circuits and circuit assemblies. In particular, the invention has application to adaptive microelectronic circuits and circuit assemblies designed for testability. Background technique [0002] Microelectronic circuits (eg, microprocessors, microcontrollers, and the like) essentially operate by passing large numbers of digital values ​​through many processing paths in a particular manner determined by programmed instructions. A processing path typically includes segments of programmed logic, between which there are register circuits for temporarily storing digital values ​​at a rate defined by a clock signal. A microelectronic circuit may also be referred to as a microelectronic system, but the concept of a microelectronic system may also be used to refer to a device comprising several microelectronic circuits. [0003] In order to ensure that a microelectronic circuit or syste...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/30G06F11/22G01R31/3185
CPCG01R31/30G01R31/318583G06F11/2236G01R31/318594G01R31/31712G01R31/31725G01R31/3173G01R31/3177
Inventor L·科斯基宁N·古普塔J·西蒙森
Owner MINIMA PROCESSOR OY