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Reflection measuring device

A reflection measurement and reflective surface technology, applied in the field of optical detection, can solve the problems of beam divergence characteristics limit double mirror design, inconvenient adjustment of double mirror spacing, mirror space limitation, etc., to reduce light background scattering, reduce Component cost, the effect of reducing space volume

Active Publication Date: 2021-06-18
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Claims
  • Application Information

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Problems solved by technology

Take the 10° reflection accessory sold by Pike tech as an example, its structure is as follows figure 1 As shown in the figure, the reflective accessory uses six symmetrically arranged reflectors. The problem caused by this design is that the detection light is seriously lost.
[0003] In addition, in order to solve the problem of limiting the space of the mirror body in the case of small incident angles, most of the existing design schemes of reflective accessories use multiple groups of symmetrical reflective structures to adjust the incident angle of the beam. Due to the combination of multiple reflectors, and These reflectors are broad-spectrum broadband reflectors, that is, the reflectors used must ensure that they are in a wide spectral range, such as the conventional near-infrared visible ultraviolet band 200nm ~ 1.7μm, and each band can achieve high reflectivity in a wide spectral range. It is very difficult. Even if the metal composite film is used, the reflectivity is less than 90% at some wavelengths. If the number of reflectors selected in the design scheme increases, the overall reflectivity of the system will decrease geometrically.
Although this design can minimize the loss of detection light, the distance between the double mirrors is too close to be adjusted, and the divergence of the beam also limits the design of the double mirrors.

Method used

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specific Embodiment 1

[0054] Such as image 3 As shown, the incident angle of the probe light incident on the optical element 3 is 10°, and the reflection angle of the probe light reflected from the optical element 3 is equal to the incident angle is also 10°. The acute angle B formed by the second reflective surface of the prismatic double-sided mirror 1 and the horizontal plane is 40°. The acute angle θ formed by the first reflective surface and the second reflective surface of the prismatic double-sided mirror 1 is preferably 30°.

[0055] For small incident angle reflectors, an important problem is that the reflector is in the middle of two beams with a small angle, and the edge of the reflector will affect the conduction of the beam. The distance between the two reflectors is solved by using a prismatic double-sided mirror. The problem is that it also saves space for the fixing fixture, and the fixture of the component can be fixed at the third side of the prismatic double-sided mirror withou...

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Abstract

The invention provides a reflection measuring device which comprises a prismatic double-sided mirror and a concave mirror. The prismatic double-sided mirror is provided with a first reflection surface and a second reflection surface, the concave mirror is arranged on a reflection light path of the first reflection surface, an optical element is arranged on a reflection light path of the concave mirror, and detection light enters the first reflection surface and is reflected to the concave mirror. The detection light enters the surface of the optical element under the angle limitation of the concave mirror, and the reflected light of the optical element is reflected by the second reflecting surface and then is emitted out along the original light path of the detection light. Compared with a multi-reflector structure, the structure of the prismatic double-sided mirror and the concave mirror is only adopted, and the detection light can be received by the detector only through four times of reflection, so that the loss of the detection light is reduced to the greatest extent, and the accuracy of reflectivity measurement is improved. Meanwhile, the problem that adjustment and light beam divergence are not facilitated due to the fact that the distance between the reflectors is too small in the design structure of the two reflectors is solved.

Description

technical field [0001] The invention relates to the technical field of optical detection, in particular to a reflection measuring device. Background technique [0002] General equipment for spectral detection includes instruments such as spectrophotometers and Fourier transform infrared spectrometers (FTIR), which are often equipped with reflectance accessories for measuring reflectivity. For large-angle reflectance measurement, the device provided by the manufacturer is relatively simple and easy to implement. However, for small-angle reflectivity measurement, most of the reflective accessories provided by manufacturers currently use a combination of mirrors with a symmetrical structure. After the detection light emitted by the light source is incident on the reflective accessory, it often needs to be reflected multiple times by the reflector before it can be detected. If the number of reflectors is too large, the energy loss of the detection light will be increased, and t...

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Application Information

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IPC IPC(8): G01N21/47G01N21/55G01N21/31G01N21/35G01N21/25
CPCG01N21/4738G01N21/474G01N21/55G01N21/31G01N21/35G01N21/255G01N2021/3595
Inventor 张立功李颜涛骆永石
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI