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Multifunctional test method for SOC chip multiplexing pin, device and system thereof

A multi-functional testing and functional testing technology, applied in the direction of error detection/correction, faulty computer hardware, instrument detection, etc., can solve the problems of crowding out the company's R&D resources, consuming the working time of engineers, and slow time progress

Active Publication Date: 2021-06-18
ANYKA (GUANGZHOU) MICROELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current solution is that hardware engineers participate in the test. For the hardware functions involved in upgrading the software function modules, each part of the function modules is manually tested and verified. This leads to a large number of repeated tests to be done on the one hand, and the time progress is relatively slow. In addition, On the one hand, it takes a lot of working time for engineers and squeezes out the company's R&D resources

Method used

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  • Multifunctional test method for SOC chip multiplexing pin, device and system thereof
  • Multifunctional test method for SOC chip multiplexing pin, device and system thereof
  • Multifunctional test method for SOC chip multiplexing pin, device and system thereof

Examples

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specific Embodiment 1

[0026] According to the flowchart of an embodiment of the multifunctional testing method of a kind of SOC chip multiplexing pin of the present invention, this method comprises the steps:

[0027] S1: Receive the functional test instruction sent by the external control board.

[0028]The process of testing the function to be tested is started by the external control board, and the test of the function to be tested starts after receiving the function test instruction sent by the external control board. Wherein, when testing different functions to be tested, the first states of the first input and output ports are different, and the respective first states of the first input and output ports need to be configured through function test instructions. Therefore, the function test instruction includes: a function test case corresponding to the function to be tested, and the function test case includes respective first port states of a plurality of first input and output ports.

[00...

specific Embodiment 2

[0041] figure 2 A flow chart of an embodiment of a multifunctional testing method of a SOC chip multiplexing pin is shown, the method may include the following steps:

[0042] SS1: Receive N functional test instructions sent by the external control board in sequence.

[0043] When there are N functions to be tested, the sequence of N function test processes can be controlled through the external control board. Specifically, when testing a certain function to be tested, the function test instruction corresponding to the function to be tested sent by the external control board is received. The function test instruction corresponding to the next function to be tested, thereby starting a new round of function test for the next function to be tested.

[0044] SS2: According to the multifunctional testing method of the multiplexing pins of the SOC chip as described above, the N functions to be tested are tested in turn, so as to obtain N test information corresponding to the N fu...

specific Embodiment 3

[0050] In addition to the above method, the present invention also provides a multifunctional testing device 11 for SOC chip multiplexing pins, image 3 A structural diagram of an embodiment of a multifunctional testing device for multiplexing pins of an SOC chip according to the present invention is shown. The device 11 includes a receiving module 111, an automatic bridge module 112 and a result output module 113.

[0051] The receiving module 111 is used for receiving function test instructions sent by the external control board, receiving interaction data between the platform board to be tested and the external device, and receiving test information corresponding to the function to be tested fed back by the platform board to be tested. Wherein, the function test instruction includes: a function test case corresponding to the function to be tested, and the function test case includes respective first port states of a plurality of first input and output ports. The multiple f...

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Abstract

The invention discloses a multifunctional test method, a device and a system for SOC chip multiplexing pins. According to the method, a first port state and a pin state are correspondingly configured according to a to-be-tested function, a corresponding communication protocol is selected, a corresponding software test code is executed for testing, and test information is generated according to a test signal. The device comprises an instruction receiving module, a function test module and a test report module. The system comprises an external control board, a platform board to be tested, an automatic test board and external equipment, wherein the automatic test board comprises the device. According to the method, the device and the system, automatic testing of any to-be-tested function is achieved through automatic bridging of the to-be-tested platform plate and the external equipment, and automatic switching testing of the multiple to-be-tested functions is achieved by sequentially sending the multiple function testing instructions through the external control panel.

Description

technical field [0001] The invention relates to the field of automatic testing of SOC chip multiplexing pins, and relates to a multifunctional testing method, device and system for SOC chip multiplexing pins. Background technique [0002] At present, the system development based on SOC chip is to carry out related design and verification work on the development board. The pins of the SOC chip are usually multiplexed into several groups of different functions. If you want to realize these multiplexed functions on the development board function, it is necessary to add an analog switch or a jumper cap to the corresponding functional module for the signal coming out of the same pin, and the current chip pins often have multiple functions. Jumper caps are used to achieve this. On the one hand, the design of the development board will be very complicated. On the other hand, when switching functions manually, there are many combinations to choose, and it is easy to make mistakes in...

Claims

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Application Information

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IPC IPC(8): G06F11/263G06F11/22
CPCG06F11/263G06F11/221
Inventor 冯白云徐畅胡胜发
Owner ANYKA (GUANGZHOU) MICROELECTRONICS TECH CO LTD
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