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Optical module test system and method

An optical module testing and optical module technology, applied in the field of testing, can solve the problems of low optical module testing efficiency and the like

Active Publication Date: 2021-06-25
SHENZHEN GIGALIGHT TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In this way, in the high and low temperature test, each time an optical module is tested, it is necessary to stop the machine and wait for the temperature to stabilize before replacing the optical module before starting to test the next optical module, resulting in low test efficiency for multiple optical modules.

Method used

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  • Optical module test system and method
  • Optical module test system and method

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Embodiment Construction

[0039] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the application are given in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.

[0040] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terms used herein in the specification of the application are only for the purpose of describing specific embodiments, and are not intended to limit the application.

[0041] It can be understood that the terms "first", "second" and the like used in this application may be...

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Abstract

The invention relates to an optical module test system and method. The optical module test system comprises a bit error tester used for transmitting and receiving a radio frequency signal; a first radio frequency switch, of which the input end is connected with the transmitting end of the bit error tester, and the output end of the first radio frequency switch is connected with the electric signal input end of the corresponding optical module; a first optical switch, of which the input end is connected with the optical signal output end of the corresponding optical module; a measuring device which is connected with the output end of the first optical switch and is used for measuring parameters of the optical module; a second optical switch, of which the input end is connected with the measuring device, and the output end is connected with the optical signal input end of the corresponding optical module; a second radio frequency switch, of which the output end is connected with the receiving end of the bit error tester, and the input end is connected with the electric signal output end of the corresponding optical module. The optical modules are switched by switching the channels of the switches.

Description

technical field [0001] The present application relates to the technical field of testing, in particular to an optical module testing system and method. Background technique [0002] At present, the actual application environment of optical modules is becoming more and more complex and harsh, and customers have higher and higher requirements for the reliability and stability of optical modules. Therefore, it is necessary to test the parameters of the optical module before leaving the factory. [0003] In the traditional technology, a test device is connected to one optical module at a time for testing. [0004] A set of test equipment tests one optical module at a time. In this way, in the high and low temperature test, each time an optical module is tested, it is necessary to stop the machine and wait for the temperature to stabilize before replacing the optical module before starting to test the next optical module, resulting in low test efficiency for multiple optical mo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/077
CPCH04B10/0775
Inventor 李俊灵桂平李振东
Owner SHENZHEN GIGALIGHT TECH
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