A chip level sorting device and method for a chip testing automated production line

Abstract

The present invention provides a chip grade sorting device and method for an automated production line for chip testing, which can effectively improve production efficiency and reduce costs. The device of the present invention comprises a replaceable grade sorting disc (1), a sorting disc conveying track (2), several grade unloading trays (3), a first variable pitch suction nozzle module (4) and a second variable pitch A suction nozzle module (5), the grade unloading tray (3) includes a corresponding number of blanking trays that are consistent with the grades set on the grade sorting tray (1); in the method of the present invention, a manipulator drives the The first variable pitch nozzle module (4) places the tested chips in the chip placement slot (6) on the grade sorting plate (1) according to the grade, and then passes the second variable pitch. The nozzle module (5) places the graded chip codes into the corresponding grade unloading tray (3). The invention can be applied to the field of equipment control.

Description

technical field [0001] The invention relates to the field of equipment control, in particular to a chip grade sorting device and method for an automated production line for chip testing. Background technique [0002] The previous chip-level sorting method is based on the level of the test results through manual manual sorting. Manual manual sorting is inefficient, which is inconvenient to improve production efficiency, thereby affecting production capacity. Workers work for a long time, which is easy to cause sorting errors due to fatigue, and the sorting effect cannot be achieved, which increases the difficulty of the management and control of chip grade sorting. [0003] Manual sorting of chip grades is inefficient and inconvenient to improve production efficiency, thereby affecting production capacity. Workers work for a long time, which is easy to cause sorting errors due to fatigue, and the sorting effect cannot be achieved, which increases the difficulty of the manage...

AI Technical Summary

Problems solved by technology

[0002] The previous chip grade sorting method was manually sorted according to the grade of the test results. Manual sorting is inefficient and inconvenient to improve production efficiency, thus affecting production capacity

Workers work for a long time, it is easy to cause sorting errors due to fatigue, and the sorting effect cannot be achieved, which increases the difficulty of the control of chip grade sorting

[0003] Manual sorting of chip grades is inefficient and inconvenient to improve production efficiency, thus affecting production capacity

Workers work for a long time, it is easy to cause sorting errors due to fatigue, and the sorting effect cannot be achieved, which increases the difficulty of the control of chip grade sorting

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