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Test equipment and test fixture

A technology for testing fixtures and fixtures, which is applied in electronic circuit testing, printed circuit testing, and electrical measurement. It can solve problems such as easy breakage of probes and affect the service life of test fixtures, and achieves avoidance of bending deformation, convenient installation, and The effect of prolonging the service life

Active Publication Date: 2021-07-09
SHENZHEN KAIMA TIMES TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, every time an adjustment is made, the probe of the test fixture will be deformed once. Under continuous bending deformation, the probe of the test fixture is easy to break, which affects the service life of the test fixture

Method used

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  • Test equipment and test fixture
  • Test equipment and test fixture
  • Test equipment and test fixture

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Embodiment Construction

[0026] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.

[0027] refer to figure 1 with image 3 , figure 1 A side view showing a test fixture according to an embodiment of the present invention, image 3 A schematic structural diagram of a circuit board disposed on a test fixture according to an embodiment of the present invention is shown. ...

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Abstract

The invention relates to test equipment and a test fixture. The test fixture comprises a fixture body, a test probe, a fixing plate and a positioning piece used for placing a circuit board. The jig body is provided with a mounting part, and the test probe is arranged on the mounting part. The positioning piece is fixed to the fixing plate and movably arranged on the jig body in a penetrating mode so that the jig body can move relative to the fixing plate. When the circuit board is tested, the fixing plate is connected to the testing equipment body, the circuit board is placed on the positioning piece, and the fixing plate and the circuit board are kept still relative to the testing equipment body. If the positions of the jig body and the circuit board are deviated, the fixing plate and the circuit board are kept still, and the test probe and the jig body are driven to be finely adjusted as a whole. Thus, bending deformation of the test probe can be avoided, the service life of the test probe is effectively prolonged, and the stability of the test fixture is higher. In addition, fine tuning is carried out on the test fixture through the fine tuning device, and a traditional fine tuning frame is not needed, so that the test fixture is more convenient to install.

Description

technical field [0001] The invention relates to the technical field of circuit board testing, in particular to a testing device and a testing fixture. Background technique [0002] The circuit board is an important electronic component in electronic products. It is a support for electronic components and a provider of electrical connections for electronic components. In the manufacturing process of circuit boards, the test steps of circuit boards are a crucial link that directly affects the quality of shipped products. [0003] Generally, the circuit board is placed on the test fixture, and the probes of the test fixture are fine-tuned by the fine-tuning device. However, every time an adjustment is made, the probe of the test fixture will be deformed once. Under continuous bending and deformation, the probe of the test fixture will be easily broken, which will affect the service life of the test fixture. Contents of the invention [0004] Based on this, it is necessary t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2806G01R31/2808
Inventor 林咏华沈炳元
Owner SHENZHEN KAIMA TIMES TECH