Reflector coupling critical finding method and device and storage medium

A mirror and critical height technology, applied to laser parts, electrical components, lasers, etc., to achieve the effect of reducing the impact of measurement errors

Pending Publication Date: 2021-07-20
WUHAN RAYCUS FIBER LASER TECHNOLOGY CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The present invention provides a mirror coupling critical finding method, equipment and storage medium to solve the problem of automatic critical finding in the mirror coupling process in the prior art

Method used

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  • Reflector coupling critical finding method and device and storage medium
  • Reflector coupling critical finding method and device and storage medium
  • Reflector coupling critical finding method and device and storage medium

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Embodiment Construction

[0069] In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the present invention. Obviously, the described embodiments are part of the embodiments of the present invention , but not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0070] Combine below Figure 1-Figure 16 Describe the structure of the mirror automatic coupling device provided by the present invention.

[0071] An embodiment of the present invention provides an automatic mirror coupling device, such as figure 1 and figure 2 As shown, it includes a tray placement mechanism 100 , a coupling movement mechanism 200 and a base adjustment mechanism 300 . ...

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Abstract

The invention provides a reflector coupling critical finding method and device and a storage medium, and relates to the technical field of semiconductor lasers. The reflector coupling critical finding method comprises steps of reducing the height of a reflector by one step length, and obtaining the power of the reflector after the height of the reflector is reduced by one step length; if the power loss before and after the reflector is reduced by one step length exceeds the allowable threshold value, judging whether the power loss exceeding the allowable threshold value is caused by measurement fluctuation; if the power loss exceeds the allowable threshold value and is not caused by the measurement fluctuation, judging whether the current height of the reflector exceeds the maximum target critical height after being lifted by one back-lifting step length; if the current height of the reflector does not exceed the maximum target critical height after being lifted by one back-lifting step length, lifting the reflector by one back-lifting step length, wherein the step length is larger than the back-lifting step length. According to the reflector coupling critical finding method and device and the storage medium provided by the invention, a better reflector critical height position can be found on the premise that the power loss conforms to expectation.

Description

technical field [0001] The invention relates to the technical field of semiconductor lasers, in particular to a mirror coupling critical finding method, equipment and storage medium. Background technique [0002] Most existing mirror coupling techniques are manually operated. For example, manually use the vacuum nozzle to absorb the reflector, manually power on, manually operate the adjustment frame to couple to the maximum power, manually adjust to find the critical point of light, manually operate the dispensing machine to dispense glue, etc. When coupling the next reflector, manual adjustment is also required base position. [0003] The mirror coupling operation process is relatively complicated, requiring relatively skilled operators. Large-scale expansion requires a large number of skilled operators. Because the manufacturing quality is affected by human factors, the consistency of the product cannot be guaranteed. How to automatically find the critical point is an im...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01S5/00
CPCH01S5/0071
Inventor 黄思琪魏秀强闫大鹏
Owner WUHAN RAYCUS FIBER LASER TECHNOLOGY CO LTD
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