Shaping circuit, test board card and test machine

Abstract

The invention discloses a shaping circuit, a test board card and a test machine, and the shaping circuit comprises an overvoltage detection unit which receives a to-be-tested signal, is used for judging whether the amplitude of the to-be-tested signal exceeds a threshold value or not, and outputting a control signal according to a judgment result; a processing unit which receives the to-be-detected signal, is connected with the overvoltage detection unit, receives the control signal, and outputs one of the to-be-detected signal and the to-be-detected signal subjected to voltage division according to the control signal; and a shaping unit which is connected with the processing unit and is used for shaping the signal output by the processing unit. The test board card can detect the amplitude of the to-be-tested signal in real time and perform voltage division on the to-be-tested signal, realizes frequency measurement of the to-be-tested signals with different amplitudes, performs shaping processing on the to-be-tested signal, and also improves the test capability of the board card.

Description

technical field [0001] The invention relates to the technical field of electronic circuits, in particular to a shaping circuit, a testing board and a testing machine. Background technique [0002] In the field of electronic product production, it is usually necessary to test the finished or semi-finished electronic products for quality inspection of electronic products. The test process is to control the tested product to enter the corresponding mode or do corresponding actions through the test board, and then collect the parameters of the tested product in various states such as voltage, current, frequency, etc., and then analyze the collected parameters to judge Whether the product under test meets the design requirements. The test process is to use the measurement board to connect to the corresponding port of the electronic product, then collect current, voltage and frequency, convert the analog quantity into a digital signal through the ADC conversion function of the me...

AI Technical Summary

Problems solved by technology

[0003] However, some testing machines, such as the STS8200 testing machine, cannot test voltage signals exceeding a certain range, such as the 25V range.

If the amplitude of the measured signal exceeds the threshold and is a square wave signal with edge jitter, then the frequency of the square wave signal cannot be effectively measured

Even if the amplitude voltage of the signal under test is too high, it will burn the board of the tester

[0004] In view of the above problems, the existing solution is to build a test circuit on the test board, which not only increases the peripheral test components and test costs, but also has problems such as loop impedance mismatch, which leads to test distortion and affects the measured object. The true manifestation of one's own function

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