Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Mock data method and device based on function calculation

A technology of data devices and functions, which is applied in the fields of electrical digital data processing, calculation, and complex mathematical operations. Develop simple effects

Pending Publication Date: 2021-07-27
INDUSTRIAL AND COMMERCIAL BANK OF CHINA
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The first method above will lead to increased dependence in project development and affect the delivery speed
Although the second method can solve the dependency problem to a certain extent, the returned content is hard-coded and not flexible enough, and the code of the linkage part needs to be modified as needed, and finally, after the development of the upstream and downstream is completed, it needs to be reworked and reworked. Modify the code of the linkage part
If any sub-node in the system is not ready, the entire full-link pressure test cannot be performed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Mock data method and device based on function calculation
  • Mock data method and device based on function calculation
  • Mock data method and device based on function calculation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] The principle and spirit of the present invention will be described below with reference to several exemplary embodiments. It should be understood that these embodiments are given only to enable those skilled in the art to better understand and implement the present invention, rather than to limit the scope of the present invention in any way. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

[0049] Those skilled in the art know that the embodiments of the present invention can be implemented as a system, device, device, method or computer program product. Therefore, the present disclosure may be embodied in the form of complete hardware, complete software (including firmware, resident software, microcode, etc.), or a combination of hardware and software.

[0050] According to the embodiment of the present invention, a method and device for Mock ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a Mock data method and device based on function calculation, which can be used in the technical field of application system development and test. The method comprises the steps of obtaining a Mock code snippet compiled by a user, and subpackaging a function calculation platform according to the Mock code snippet; writing a function code through the function calculation platform, creating a trigger for the function code and deploying a Mock function; obtaining unoccupied server resources, deploying a function operation node, and issuing he Mock function to the function operation node; performing upstream and downstream Mock joint debugging by using the Mock function of the function operation node, wherein when a current application system needs to be simulated to call a downstream dependent application, configuring the downstream address of the current application system to be a function http address for data Mock; and when tan upstream dependent application needs to be simulated to call the current application system, creating an upstream Mock service of the current application system to call the current application system.

Description

technical field [0001] The invention relates to the technical field of application system development and testing, in particular to a Mock data method and device based on function calculation. Background technique [0002] Since most business systems are composed of multiple business subsystems, in the daily development and testing process, it often happens that the current subsystem needs to be debugged in conjunction with the upstream and downstream. At present, there are mainly two methods in the existing technology: [0003] 1. After the upstream and downstream development is completed, then develop and debug the current subsystem. [0004] 2. Write a return value in the linkage code for development. After the upstream and downstream development is completed, modify and replace this part of the code. [0005] The first method above will lead to increased dependence in project development and affect the delivery speed. Although the second method can solve the dependenc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F11/36G06F17/15
CPCG06F11/3672G06F17/15
Inventor 周文泽陆新龙谢伟吴冕冠
Owner INDUSTRIAL AND COMMERCIAL BANK OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products