Electrochemical reaction tank device suitable for scanning probe microscope

Abstract

The invention discloses an electrochemical reaction tank device suitable for a scanning probe microscope. The electrochemical reaction tank device comprises a reaction tank main body, a sealing ring, a reaction tank cover, a positioning iron block, a red copper electrode and a metal clamping ring, wherein a cover body embedding groove, a reference electrode inserting groove, a counter electrode inserting groove and a sample embedding groove are formed in the front surface of the reaction tank main body, the sealing ring participates in guiding and fixing of a reference electrode and a counter electrode wire while preventing liquid leakage, a block sample is embedded into a sample groove in the bottom of the reaction tank main body, an electrode connecting hole is formed in the bottom of the sample groove, a red copper electrode block is inserted to conduct a second working electrode circuit and help to take out a sample, a magnetic fixed positioning iron block is embedded into the bottom of the tank body to help to fix the reaction tank, and the metal clamping ring for preventing the reaction tank from deforming is inserted into an annular groove below the reaction tank main body. The device is small in size, simple in structure and high in reliability, and can be perfectly matched with an electrochemical module of a scanning probe microscope, so that the matching problem of scanning of a block-shaped sample in an SECM-AFM mode is solved.

Description

technical field [0001] The invention relates to an electrochemical reaction cell device suitable for a scanning probe microscope, belonging to the fields of electrochemistry and electrocatalysis. Background technique [0002] Scanning Probe Microscope (SPM) technology can analyze and measure the physical properties of various materials at the nanometer scale or conduct nanomanipulation in the atmosphere, liquid phase and ultra-high vacuum environment, and has become an important tool for nanoscience research. Scanning probe microscopy can work on the micro / nano scale. According to the difference in the physical quantity detection signal between the probe and the sample, various modules with functionalization can be refined, including mechanical atomic force microscopy (AFM), conductive force microscopy (c-AFM), piezoelectric response atomic force microscopy (PFM) ), scanning capacitive atomic force microscopy (SCM), electrostatic atomic force microscopy (EFM), Kelvin probe ...

AI Technical Summary

Problems solved by technology

[0003] Although SECM-AFM modules and probes that can be used commercially have been developed, but because different researchers have differ

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