Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Neural network configuration parameter training and deploying method and device for coping with device mismatch

A technology of network configuration parameters and configuration parameters, applied in neural learning methods, biological neural network models, neural architectures, etc., can solve problems such as the inability of large-scale commercial deployment of chip configuration parameters, weakening of neural network task processing performance, etc., to avoid attacks Unnecessarily worsening, optimizing the effect of configuration parameters

Pending Publication Date: 2021-08-27
HENGDU SYNSENSE TECH CO LTD
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0015] In view of the above-mentioned defects in the prior art, the technical problem to be solved by the present invention is: how to deal with the problem that the neural network task processing performance is weakened due to the comprehensive random disturbance of the configuration parameters of the neural network accelerator, and then the configuration parameters of the chip caused cannot Problems with Large-Scale Commercial Deployment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Neural network configuration parameter training and deploying method and device for coping with device mismatch
  • Neural network configuration parameter training and deploying method and device for coping with device mismatch
  • Neural network configuration parameter training and deploying method and device for coping with device mismatch

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0140] As used herein, "using", "from", "on", or "based on", "based on" at least one object ( For example, at least one object of at least one verb), at least one operation performed "directly using," "directly from," "directly," "directly based on," or "based on" at least one object, or at least one intervening operation can occur. Conversely, when at least one operation is called "directly using", "directly from", "directly on", "directly on basis of".

[0141] figure 1 The system schematic diagram shown is a network configuration parameter space performance loss topography 100 described in prior art 1, which describes a step of a simulated attack on neural network parameters. figure 2 The system schematic diagram shown is a network configuration parameter space performance loss topography 100 described in prior art 1, which describes a step for updating neural network parameters. refer to figure 1 and figure 2 , in the network configuration parameter space performance l...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a neural network configuration parameter training and deployment method and device. The method comprises the steps of searching simulated attacked neural network configuration parameters based on neural network configuration parameters, so that the attacked neural network configuration parameters move in the direction deviating from the output result of a neural network corresponding to the neural network configuration parameters to the maximum extent; taking the difference between the current neural network configuration parameter and the neural network output result corresponding to the attacked neural network configuration parameter as a robust loss function, and taking the robust loss function as a part of a total loss function; and finally, optimizing neural network configuration parameters based on the total loss function. Especially for ultra-low power consumption sub-threshold and mixed signal circuits, the scheme can solve the problem of configuration parameter disturbance caused by device mismatch, and the technical effect of low-cost and high-efficiency neural network accelerator parameter deployment is achieved.

Description

technical field [0001] The invention relates to the field of training of neural network configuration parameters, in particular to the field of neural network training based on configuration parameters against attacks that can deal with the problem of device mismatch. Background technique [0002] Mixed-signal (mixed-signal) circuits have a very obvious power consumption advantage over digital circuits. Neural Network (NN) accelerators (hereinafter referred to as NN) accelerators may be implemented as mixed-signal circuits through silicon chip manufacturing methods. These fabrication methods introduce variables in the thickness and properties of the material layers from which the chip is made. These variables can cause the electrical behavior of fabricated transistors and other devices to vary widely across the surface of a single chip and vary from chip to chip, a phenomenon known as "device mismatch." Neuromorphic (also known as brain-like) neural network accelerators, s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06N3/04G06N3/063G06N3/08
CPCG06N3/08G06N3/065G06N3/044G06N3/04G06N5/01
Inventor 理查德·缪尔·迪兰布切尔·朱利安法伯尔·芬恩
Owner HENGDU SYNSENSE TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products