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Appearance defect detection method

A detection method and a technology for appearance defects, which are applied in image data processing, instruments, calculations, etc., can solve the problems of a large number of training samples, limitations, and detection accuracy affected by human subjectivity, and achieve good detection results and good robustness.

Pending Publication Date: 2021-08-27
深圳市杰恩世智能科技有限公司
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AI Technical Summary

Problems solved by technology

Using manual methods for defect detection, the detection accuracy is affected by human subjectivity; using deep learning requires a large number of training samples, and is also subject to many restrictions in actual industrial scenarios

Method used

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  • Appearance defect detection method
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Embodiment Construction

[0025] All features disclosed in this specification, or steps in all methods or processes disclosed, may be combined in any manner, except for mutually exclusive features and / or steps.

[0026] Any feature disclosed in this specification (including any appended claims, abstract and drawings), unless expressly stated otherwise, may be replaced by alternative features which are equivalent or serve a similar purpose. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.

[0027] In describing the invention, it is to be understood that the terms "one end", "other end", "outer side", "upper", "inner side", "horizontal", "coaxial", "central", "end" , "length", "outer end" and other indicated orientations or positional relationships are based on the orientations or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, ra...

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Abstract

The invention discloses an appearance defect detection method, which comprises the steps of setting position correction, and performing position offset correction on an input image; training the image after position offset correction, and calculating a good product model; calculating defects of the to-be-detected image, and judging whether the sample is qualified or not. According to the method, the tiny defects on the appearance of the product can be accurately and rapidly detected, good robustness is also achieved for tiny deformation of a detected target, and the detection effect is good.

Description

technical field [0001] The invention relates to the technical field of appearance inspection, in particular to an appearance defect inspection method. Background technique [0002] In the process of product production, in order to ensure the quality of the product, it is usually necessary to test the product to avoid defective products. Appearance defect inspection has applications in many industries such as pad printing inspection, laser engraving, etc. Using manual methods for defect detection, the detection accuracy is affected by human subjectivity; using deep learning requires a large number of training samples, and is also subject to many restrictions in actual industrial scenarios. [0003] In order to solve the above problems, this application proposes a defect detection method suitable for industrial scenarios, which requires only a small number of training images to perform defect detection. Contents of the invention [0004] The invention provides an appearanc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00G06T7/00
CPCG06T7/0004G06T2207/10024G06T2207/20081G06T5/80
Inventor 王冲张永鹏武亚飞李亚辉何明
Owner 深圳市杰恩世智能科技有限公司
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