A load board test system and method based on m-lvds bus
A test system and test method technology, applied in the field of rail transit, can solve the problems of poor anti-risk ability, weak usability, affecting test efficiency, etc., to avoid debugging time, save test time, and reduce economic costs.
Active Publication Date: 2022-07-12
CASCO SIGNAL
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Problems solved by technology
[0003] In the prior art, in order to realize the load board test under long-distance data transmission, the load boards of two chassis are usually cascaded. If a device component in one of the chassis fails and affects the normal test of the load board, it must be replaced. Faulty Chassis
Not only the cross-chassis wiring is complicated, but the wrong operation of replacing the faulty chassis may cause the normal chassis to be affected and not work normally
[0004] The load board test device in the prior art is completely based on one M-LVDS bus to transmit data signals, the signal quality of the M-LVDS bus is low, the anti-risk ability is poor, and the usability is weak
[0005] Therefore, the existing technology cannot fully meet the load board test requirements based on the M-LVDS bus, which affects the test efficiency
Method used
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[0051] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0052] like figure 1 , Figure 4 As shown, the present invention provides a load board test system based on the M-LVDS bus, including a plurality of load boards, a backplane, a first power board 41, a second power board 42, a first to a fourth power board arranged in a chassis Matching resistors 51 to 54 , jumper cap 61 , first connector 62 , and second connector 63 .
[0053] In the embodiment of the present invention, there are 32...
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The present invention provides a load board testing system and method based on M-LVDS bus, the system includes: two sets of load boards, one load board is the main board, and the rest are slave boards; , the second M-LVDS bus; the main board is provided with a program, the program is configured to send the first and second test signals to the slave board through the first and second M-LVDS bus respectively when the main board is powered on, and the slave board According to the received first and second test signals, the first and second feedback signals are sent to the main board through the corresponding first and second M-LVDS buses, and the main board judges the slave board according to the received first and second feedback signals. Whether the function of the first and second M‑LVDS buses of the A jumper cap is arranged between the first and second connectors, and through the jumper cap, the first and second connectors realize the cascade connection of two sets of load boards on the second M‑LVDS bus.
Description
technical field [0001] The invention relates to the field of rail transit, in particular to a load board testing system and method based on an M-LVDS bus. Background technique [0002] The control system of the rail transit industry usually uses the load board to process the data, and the data transmission must have the characteristics of high speed, real-time and high reliability. Generally speaking, data transmission is performed between each load board through an M-LVDS (Multipoint low Voltage Differential Signaling) bus, and the backplane is used as a carrier for M-LVDS bus transmission. To ensure the security of the system, the data transmission function of each load board needs to be tested before the system is put into use. In order to save costs, the backplane and load board to be tested are set in a standard chassis. Due to the size limitation of the backplane and the chassis, only a small number of load boards can be tested at a time, resulting in low test efficie...
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IPC IPC(8): H04L41/06H04L43/08H04L25/02H04L67/12
CPCH04L41/06H04L43/08H04L25/0272H04L67/12
Inventor 丁娜潘雷刘辉王庆勇郑琼
Owner CASCO SIGNAL