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Test method and device and electronic equipment

A test method and technology of electronic equipment, applied in the computer field, can solve problems such as spending a lot of time, the CPU cannot be used efficiently, and the problem cannot be analyzed.

Pending Publication Date: 2021-09-28
DONGGUAN ELF EDUCATIONAL SOFTWARE CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Some machines with poor CPU quality will have various random exceptions, such as data exceptions, function jump exceptions, and other software-like exceptions. Generally, it is impossible to analyze the specific problem.
If the problem of poor CPU quality cannot be ruled out, it may take a lot of time to analyze the software problem, resulting in the failure to find the root cause and solve the problem, resulting in the CPU not being used efficiently

Method used

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  • Test method and device and electronic equipment
  • Test method and device and electronic equipment
  • Test method and device and electronic equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] An embodiment of the present invention, such as figure 1 As shown, the present embodiment provides a test method, comprising the following steps:

[0047] S100 sets preset test conditions, and dynamically switches the number of cores, cores or frequencies of the CPU based on the preset test conditions and the switching command.

[0048] Specifically, the number of cores, the dynamic switching of cores or frequencies of the CPU is controlled by setting preset test conditions.

[0049] Among them, the core (Die), also known as the core, is the most important part of the CPU. The raised chip in the center of the CPU is the core, which is made of monocrystalline silicon with a certain production process. All calculations, receiving / storing commands, and processing data of the CPU are executed by the core. Various CPU cores have a fixed logical structure, and logical units such as L1 cache, L2 cache, execution unit, instruction level unit, and bus interface will have a sci...

Embodiment 2

[0073] Another embodiment of the present invention, this embodiment provides a test method, comprising the following steps:

[0074] S100 sets preset test conditions, and dynamically switches the number of cores, cores or frequencies of the CPU based on the preset test conditions and the switching command.

[0075] Specifically, the number of cores, the dynamic switching of cores or frequencies of the CPU is controlled by setting preset test conditions.

[0076] Exemplarily, there are configuration registers inside the chip, that is, the CPU, and the preset test conditions are set by writing the preset test files into the configuration registers. Change the limited number of cores, cores and frequency by setting the CPU configuration register.

[0077] Wherein, S100 sets preset test conditions, and dynamically switches the number of cores, cores or frequencies of the CPU based on the preset test conditions and switching commands, such as figure 2 As shown, the following tes...

Embodiment 3

[0107] The present invention also provides an embodiment of a test device, such as image 3 shown, including:

[0108] Switching module 101 is used to set preset test conditions, and dynamically switches the number of cores, cores or frequencies of CPU based on the preset test conditions and switching commands.

[0109] The testing module 102 is configured to call the CPU test running file to test the CPU when switching.

[0110] Wherein, the preset test conditions include a preset number of CPU cores, a preset CPU core, a preset CPU frequency, and a preset CPU usage frequency.

[0111] In this embodiment, by testing the working status of each core and frequency of the CPU, and calling the abnormal data of the CPU, the problem of poor CPU quality can be located, so as to realize efficient use of the CPU.

[0112] Through this embodiment, it can be realized that by limiting the number of cores of the CPU, limiting the frequency, and randomly switching the frequency, a complex...

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Abstract

The invention belongs to the technical field of computers, and provides a test method and device and electronic equipment. The method comprises the steps: setting a preset test condition, and dynamically switching the core number, core or frequency of a CPU based on the preset test condition and a switching command; when switching is carried out, calling a CPU test running file and testing the CPU; wherein the preset test condition comprises a preset CPU core number, a preset CPU core, a preset CPU frequency and a preset CPU use frequency. According to the method, complex and heavy operation testing is carried out on the CPU under the conditions that the number of cores is limited, the frequency is limited and the frequency is randomly switched, the CPU which is abnormal in the testing process, namely the CPU which is poor in quality is obtained, then the reason for CPU hardware abnormity can be located, and therefore the CPU is efficiently used.

Description

technical field [0001] The present invention relates to the field of computer technology, in particular to a testing method, device and electronic equipment. Background technique [0002] The central processing unit (CPU) is the computing and control core of the computer system and the final execution unit for information processing and program operation. Since the CPU was produced, it has made great progress in logic structure, operating efficiency and function extension. [0003] Some machines with poor CPU quality will have various random exceptions, such as data exceptions, function jump exceptions, and other software-like exceptions. Generally, it is impossible to analyze the specific problem. If the problem of poor CPU quality cannot be ruled out, it may take a lot of time to analyze the software problem, resulting in the failure to find the root cause and solve the problem, resulting in the inability to use the CPU efficiently. Contents of the invention [0004] T...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2236G06F11/2273
Inventor 李远强
Owner DONGGUAN ELF EDUCATIONAL SOFTWARE CO LTD