Method for measuring voltage drop of chip and related product
A measurement method and chip technology, applied in measurement devices, measurement of electrical variables, measurement of current/voltage, etc., can solve problems such as inaccurate IRdrop measurement
Active Publication Date: 2021-10-08
XIAMEN UNISOC TECH CO LTD
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Problems solved by technology
[0003] The existing IR drop measurement method is realized based on circuit design, but based on circuit design is a simulation result, there is a certain difference between it and the actual chip IR drop, and the IR drop measurement is not accurate
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[0028] Embodiments of the present application are described below with reference to the drawings in the embodiments of the present application.
[0029] The term "and / or" in this application is only an association relationship describing associated objects, which means that there may be three relationships, for example, A and / or B, which may mean: A exists alone, A and B exist simultaneously, and A and B exist alone. There are three cases of B. In addition, the character " / " in this article indicates that the contextual objects are an "or" relationship.
[0030] "Multiple" appearing in the embodiments of the present application means two or more. The first, second, etc. descriptions that appear in the embodiments of this application are only for illustration and to distinguish the description objects. Any limitations of the examples. The "connection" in the embodiment of the present application refers to various connection methods such as direct connection or indirect conne...
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The embodiment of the invention provides a method for measuring the IR drop of a chip and a related product. The method comprises the steps of: carrying out simulation measurement on a chip to obtain the maximum speed-voltage simulation data of a plurality of temperature values, constructing a plurality of simulation curves corresponding to the plurality of temperatures according to the maximum speed-voltage simulation data of the plurality of temperature values, and determining voltage values V1 of voltage conversion points of the plurality of simulation curves of the chip according to the plurality of simulation curves; carrying out actual measurement on the chip to obtain maximum speed-voltage actual data of a plurality of temperature values, constructing a plurality of actual curves corresponding to the plurality of temperatures according to the maximum speed-voltage actual data of the plurality of temperature values; and determining voltage values V2 of voltage conversion points of the plurality of actual curves of the chip according to the plurality of actual curves; and calculating the voltage drop value of the chip according to the V1 and the V2. The technical scheme provided by the invention has the advantage of high measurement precision.
Description
technical field [0001] The present application relates to the field of chip technology, in particular to a method for measuring voltage drop of a chip and related products. Background technique [0002] IR drop (chip voltage drop) refers to a phenomenon in which the voltage drops and rises on the power and ground networks in integrated circuits. With the continuous evolution of semiconductor technology, the width of metal interconnection lines is getting narrower and narrower, resulting in increasing resistance value (supply voltage is also getting smaller and smaller), and the effect of IR drop is becoming more and more obvious. Therefore, IR drop measurement and analysis become particularly important, and IR drop data also provide an effective basis for IR drop improvement and IR drop compensation during chip application. [0003] The existing IR drop measurement method is realized based on the circuit design, but the circuit design is a simulation result, which is differ...
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IPC IPC(8): G01R19/10
CPCG01R19/10Y02D10/00
Inventor 钟晓炜郑国忠
Owner XIAMEN UNISOC TECH CO LTD