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Method and system for measuring g-sensitivity of quartz oscillators

A quartz oscillator, sensitivity technology, used in acceleration measurements using inertial forces, power oscillators, multi-dimensional acceleration measurements, etc.

Active Publication Date: 2021-10-08
TOPCON POSITIONING SYST INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Embodiments described herein include methods and systems for measuring the g-sensitivity of a quartz oscillator in a manner that overcomes the problems and challenges of conventional testing methods

Method used

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  • Method and system for measuring g-sensitivity of quartz oscillators
  • Method and system for measuring g-sensitivity of quartz oscillators
  • Method and system for measuring g-sensitivity of quartz oscillators

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Embodiment Construction

[0024] Various illustrative embodiments will now be described more fully with reference to the accompanying drawings in which some illustrative embodiments are shown. It should be understood, however, that there is no intent to limit illustrative embodiments to the particular forms disclosed, but on the contrary, illustrative embodiments are to cover all modifications, equivalents, and alternatives falling within the scope of the claims. Like reference numerals refer to like elements throughout the description of the figures. It will be understood that, although the terms first, second etc. are used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without departing from the scope of illustrative embodiments. As used herein, the term "and / or" ...

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Abstract

A method and system are provided for estimating the g-sensitivity of a quartz oscillator, which includes rotating the quartz oscillator successively around each of a plurality of axes constituting a full-rank system, measuring a frequency of the quartz oscillator at a predetermined rate as a function of time during rotation, and estimating an integral g-sensitivity vector while the quartz oscillator is rotated. Estimation can be performed utilizing a data fitting and estimation model, e.g., a Least Square Method (LSM) in one example, using the frequency measurements obtained while the quartz oscillator is in rotation around the axes. The method and system are especially useful for measuring g-sensitivity of quartz oscillators that are incorporated in high-precision systems, such as navigation receivers, which operate in environments that are subjected to vibrational effects and other mechanical forces.

Description

technical field [0001] The present invention relates generally to testing components and systems employing quartz oscillators, and more particularly to measuring the sensitivity of quartz oscillators used in navigation systems and the like to the effects of acceleration. Background technique [0002] Quartz oscillators are used in many different devices, systems and applications that require a stable frequency reference including, for example, computers, communications, radiolocation and navigation. Quartz oscillators often provide the necessary frequency stability and can be a more cost-effective alternative to atomic, rubidium, and other frequency references. [0003] A key performance metric for an oscillator is frequency stability in the presence of environmentally induced effects, some of which can lead to significant performance degradation of devices and systems incorporating the oscillator. For example, frequency stability is a critical design parameter for oscillat...

Claims

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Application Information

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IPC IPC(8): G01R23/02H03H9/19H03L1/00
CPCH03B5/32G01H13/00H03L1/00G01P15/18H03B5/04G01P15/03
Inventor 马克·伊萨科维奇·霍季希斯基弗拉基米尔·维克托洛维奇·别洛格拉佐夫丹尼拉·斯维亚托斯拉沃维奇·米柳京罗曼·瓦莱列维奇·库里宁瓦季姆·鲍里索维奇·库兹米奇耶夫谢尔盖·维克托罗维奇·罗加乔夫
Owner TOPCON POSITIONING SYST INC
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