Spectral reflectivity determination method, device and equipment
A technology of spectral reflectance and determination method, applied in measurement devices, measurement of scattering characteristics, material analysis by optical means, etc., can solve the problem that structural changes cannot be ignored, the object to be measured cannot be regarded as a uniform plane, and distance changes cannot be issues such as being ignored
Pending Publication Date: 2021-10-22
SHENZHEN ORBBEC CO LTD
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[0003] However, in close-range observation scenarios, the structural changes on the surface of the object to be measured cannot be ignored, and the distance changes between different parts of the object to be measured and the light source cannot be ignored. At this time, the object to be measured cannot be regarded as a uniform plane, so it cannot Use a diffuse reflector with a fixed attitude and position to obtain the irradiance received by different parts of the object to be measured
That is to say, in the actual measurement, the irradiance received by the object to be measured and the irradiance received by the diffuse reflector are quite different in some scenarios, and the difference in irradiance between the diffuse reflector and the surface of the object will lead to Error in spectral reflectance
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[0068] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
[0069] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other Presence or addition of features, wholes, steps, operations, elements, components and / or collections thereof.
[0070] It should...
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The invention is applicable to the technical field of optics, and provides a spectral reflectivity determination method. The method comprises the following steps: acquiring a registration depth map and a target spectral image; obtaining the depth information of the target point and the depth information of the diffuse reflection plate from the registration depth map; obtaining a first gray value of the target point and a second gray value of the diffuse reflection plate from the target spectral image; correcting the second gray value according to the depth information of the target point and the depth information of the diffuse reflection plate to obtain a third gray value; and acquiring the reflectivity of the diffuse reflection plate, and calculating the reflectivity of the target point according to the reflectivity of the diffuse reflection plate, the first gray value and the third gray value. According to the method, the spectral reflectivity is calculated by correcting the gray value of the diffuse reflection plate with the determined position and posture. Therefore, the large difference between the irradiance received by the object to be measured and the irradiance received by the diffuse reflection plate in some scenes is avoided, and the possible error of the spectral reflectivity during calculation is further avoided.
Description
technical field [0001] The present application belongs to the field of optical technology, and in particular relates to a method, device and equipment for determining spectral reflectance. Background technique [0002] When measuring the spectral reflectance, an indirect measurement method can be used. The indirect measurement method directly uses the ratio of the target gray value detected by the spectral detection equipment to the gray value of the reference diffuse reflection plate to calculate the spectral reflectance. When using the indirect measurement method, an important prerequisite is that the irradiance received by the object to be measured should be equal to the irradiance received by the diffuse reflector, that is, the diffuse reflector should be as close as possible to the object to be measured, so as to obtain the final measurement results. [0003] However, in close-range observation scenarios, the structural changes on the surface of the object to be measur...
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CPCG01N21/4738
Inventor 师少光吕晓波刘敏张雅琴
Owner SHENZHEN ORBBEC CO LTD