Aging test equipment and aging test method thereof

A technology of aging test and detection method, applied in the direction of measuring electricity, measuring device, measuring electrical variables, etc., can solve the problem of inconvenient feeding of aging test equipment, and achieve the effect of improving production safety, avoiding damage, and improving detection efficiency.

Pending Publication Date: 2021-10-22
ZHONGSHAN JIANGBOLONG ELECTRONICS CO LTD
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  • Abstract
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  • Application Information

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Problems solved by technology

[0003] In view of the above problems, the present invention provides an aging test equipment and its...

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  • Aging test equipment and aging test method thereof
  • Aging test equipment and aging test method thereof
  • Aging test equipment and aging test method thereof

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Embodiment Construction

[0036] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0037]The terms "first", "second", and "third" in the present invention are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, features defined as "first", "second", and "third" may explicitly or implicitly include at least one of these features. In the description of the present invention, "plurality" means at least two, such as...

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Abstract

The invention discloses aging test equipment and an aging detection method thereof. The aging test equipment comprises a test board, an aging cabinet, a bearing table and a material hooking mechanism; a to-be-tested element is arranged on the test board; the aging cabinet is used for performing aging detection on the to-be-detected element; the bearing table is arranged outside the aging cabinet; and the material hooking mechanism is arranged in the aging cabinet and is used for pulling the test board on the bearing table into the aging cabinet or pushing the test board provided with the to-be-tested element out of the aging cabinet after detection is completed so as to be used for automatically loading and unloading the aging test equipment. Compared with manual carrying of the test board and the to-be-tested element, the aging test equipment has the following advantages that: the detection efficiency of the aging test equipment can be improved; safety accidents such as damage to the test board and the to-be-tested element or accidental injury to detection personnel caused by falling of the test board can be avoided, and the production safety is further improved.

Description

technical field [0001] The invention relates to the technical field of high and low temperature aging testing, in particular to an aging testing device and an aging testing method thereof. Background technique [0002] At present, electronic products, whether they are original components, components, complete machines, or equipment, must undergo aging and testing. After the electronic product has been manufactured, it has formed a complete product and can already exert its value in use, but there will be one or another failure after use. According to the statistical results, the distribution of failures in the life cycle of electronic products can be represented by a bathtub curve, that is, the failures of electronic products mostly occur within a period of initial work. Aging test is an important means to accelerate electronic products through this period. Its principle is to apply a certain overstress (high temperature or high voltage) to electronic products, so that som...

Claims

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 庞卫文
Owner ZHONGSHAN JIANGBOLONG ELECTRONICS CO LTD
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