Device for testing based on ATE

A technology for testing connections and mounting seats, which is applied in the field of computer power supply testing, and can solve the problems of time-consuming, hard work, and low work efficiency, and achieve the effects of improving test applicability, production efficiency, and test speed

Inactive Publication Date: 2021-11-05
SHENZHEN HUIKEYUAN CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] But for now, in many computer power supply production lines, the integrated circuit detection of computer power supply is often done by manually connecting the ATE integrated circuit automatic detection machine with the computer power supply. The integrated circuit automatic detection machine generally leads to a female interface and For the sub-interface, manually connect the female interface with the computer power socket, and connect the sub-interface with the computer power lead to form a closed loop to detect the computing power. The number of computer power supplies is not large. Combined with some wrong tests, or computer power supplies that require multiple tests and retests, it will consume a lot of working time for the staff, and the work efficiency is too low. It is really hard work.

Method used

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  • Device for testing based on ATE
  • Device for testing based on ATE
  • Device for testing based on ATE

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0056] refer to figure 1 , a device based on ATE testing, including a frame 1, the frame 1 is a rectangular frame structure as a whole, universal wheels are installed on the bottom of the frame 1, the universal wheels have self-locking ability, the frame 1 can be adjusted and fixed in position according to the use situation, and the machine platform 2 is installed on the top surface of the frame 1, and the machine platform 2 and the frame 1 are fixed by bolt connection.

[0057] refer to figure 1 , figure 2 , in this embodiment, an assembly platform 3 is installed on the top of the machine platform 2, the assembly platform 3 includes a bottom plate 31 and a top platform 32, the plane size of the bottom plate 31 is greater than the plane size of the top platform 32, and the top of the bottom plate 31 The rubber plate 33 is laid on the surface, and the setting of the rubber plate 33 improves the frictional force on the top surface of the base plate 31, which can be used to pl...

Embodiment 2

[0073] In this embodiment, the difference from Embodiment 1 lies in the drive section.

[0074] In this embodiment, the driving part includes a driving cylinder, which is installed on the side wall of the top platform, the output end of the driving cylinder is inserted into the chute and assembled with the slider, and the output direction of the driving cylinder is the vertical direction , the driving cylinder can drive the slider to move along the extending direction of the chute, so as to drive the test connecting socket to move vertically.

Embodiment 3

[0076] In this embodiment, the difference from the other embodiments lies in the drive section.

[0077] In this embodiment, the drive part includes a drive motor, the drive motor is a servo motor, the drive motor is installed at the side wall of the top platform, the output end of the drive motor is equipped with a threaded vertical rod, and the threaded vertical rod is inserted into the chute In the middle, the threaded vertical rod is rotatably connected with the inner wall of the chute in the chute, the extension direction of the threaded vertical rod is consistent with the extension direction of the chute, the threaded vertical rod passes through the slider and is threadedly connected with the slider, and the driving motor The threaded vertical rod can be driven to rotate, and the rotation of the threaded vertical rod can drive the slider to displace along the extending direction of the chute, thereby driving the test connection female seat to displace in the vertical dire...

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PUM

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Abstract

The invention relates to a device for testing based on ATE and belongs to the technical field of computer power supply detection. The device comprises a rack, a machine table which is arranged at the top of the rack, a test connection sub-seat which is mounted at the top of the machine table, a test connection female seat which is mounted at the top of the machine table, and an integrated circuit automatic detection machine which is mounted at the top of the machine table, wherein a primary interface and a secondary interface are led out of the integrated circuit automatic detection machine, the primary interface is electrically connected with the test connection female seat, the secondary interface is electrically connected with the test connection sub-seat, and when the integrated circuit automatic detection machine is used for testing, the test connection female seat is matched with a computer power supply socket end, and the test connection sub-seat is matched with a computer power supply lead end. In order to improve detection efficiency of a computer power supply, the invention provides a device for testing based on ATE.

Description

technical field [0001] This application relates to the field of computer power detection, in particular to a device for testing based on ATE. Background technique [0002] In the manufacturing process of all electronic components (Device), there is a need to remove the false and keep the real. This need is actually an experimental process, and its purpose is mainly to screen defective products and prevent them from entering the next process. , to reduce redundant manufacturing costs in the next process. [0003] These links need to be grasped through various physical parameters. These parameters can be various parameters such as light, electricity, waves, and mechanics in the real physical world. However, most of the common ones at present are electronic signals. What the staff have to consider the most is the parameters of the electronic signal part, such as time, phase, voltage and current, and other basic physical parameters. [0004] In order to realize this process, v...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/40G01R31/28G01R1/04
Inventor 梅仁波
Owner SHENZHEN HUIKEYUAN CO LTD
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