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Electronic component pin testing mechanism

A technology of electronic components and testing institutions, which is applied to the parts of electrical measuring instruments, measuring electronics, measuring devices, etc., and can solve problems such as high cost and complex structure

Pending Publication Date: 2021-11-09
HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the structure of traditional testing institutions is relatively complex and the cost is relatively high

Method used

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Embodiment Construction

[0041] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0042] In the invention, unless otherwise clearly specified and limited, the term "connection" should be interpreted in a broad sense, for example, the term "connection" can be a fixed connection, a detachable connection, or an integral connection; it can also be Mechanical connection; it can be directly connected, or connected through an intermediary, and can be internally connected between two components. Those of ordinary skill in the art can understand the...

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Abstract

Provided is an electronic component pin testing mechanism. The electronic component pin testing mechanism comprises a base, a lead screw structure, a first sliding part, a second sliding part, an adsorption structure and a probe. The lead screw structure is fixedly connected to one side of the base. The first sliding part is arranged on the lead screw structure in a sliding mode. The second sliding part is arranged on the first sliding part in a sliding mode. The adsorption structure is arranged on the second sliding part and used for adsorbing an electronic element. The probe corresponds to the electronic element, and the probe is electrically connected to testing equipment. The testing equipment tests the performance of the electronic component through the probe. The electronic component pin testing mechanism can effectively test the performance of the electronic component, and is simple in structure, low in cost and easy to process and manufacture.

Description

technical field [0001] The invention relates to a testing mechanism for pins of electronic components. Background technique [0002] At present, electronic components have hundreds of specifications, and choosing the correct electronic components can ensure that the performance of the circuit meets the requirements. Therefore, in actual selection, it is often necessary to select excellent electronic components through testing institutions. However, the structure of traditional testing institutions is more complicated and the cost is higher. Contents of the invention [0003] In view of this, it is necessary to provide an electronic component pin testing mechanism with simple structure and low cost. [0004] An electronic component pin testing mechanism, the electronic component pin testing mechanism includes a base, a screw structure, a first sliding part, a second sliding part, an adsorption structure and a probe, and the screw structure is fixedly connected to the One...

Claims

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Application Information

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IPC IPC(8): G01R1/04G01R31/01
CPCG01R1/0408G01R31/01G01R1/07307G01R31/00
Inventor 陈俊吴炜闫艳芳张振科柳志强
Owner HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO LTD