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Integrated circuit electronic component testing system

A technology of electronic components and testing systems, which is applied to parts, instruments, and measuring electronics of electrical measuring instruments, and can solve the problem of reducing the working efficiency of electronic component testing instruments, increasing the testing time of electronic components, and consuming a lot of time, etc. question

Inactive Publication Date: 2021-11-19
王晓龙
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Electronic components are components of electronic components and small machines and instruments. They are often composed of several parts and can be used in similar products. They often refer to certain parts in industries such as electrical appliances, radios, and instruments. Electronic components are used in After the factory produces and processes, its electrical performance parameters need to be tested to ensure the safety and stability of the electronic components. However, after the electronic components are soldered on the circuit board, they need to be tested manually. Due to the small area, it takes a lot of time It takes a lot of time to test and test it, which cannot meet the market's production demand for electronic components, and because electronic components have different sizes, electronic components of the same size need to be manually sorted out in batches before testing testing, resulting in an increase in the testing time of electronic components, thereby reducing the work efficiency of electronic component testing instruments

Method used

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  • Integrated circuit electronic component testing system
  • Integrated circuit electronic component testing system
  • Integrated circuit electronic component testing system

Examples

Experimental program
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Embodiment 1

[0022] as attached figure 1 to attach Figure 4 Shown:

[0023] The present invention is an integrated circuit electronic component testing system, its structure includes a discharge port 1, a top cover 2, a processing device 3, and a bottom plate 4, the discharge port 1 is embedded and fixed on the front surface of the processing device 3, and the top cover 2 Welded on the upper surface of the processing device 3, the upper end of the bottom plate 4 is provided with a discharge port 1, the processing device 3 is fixedly installed on the upper surface of the bottom plate 4, the processing device 3 includes a shell 31, a material inlet 32, a sorting Device 33, collecting tank 34, adjusting device 35, the top of the housing 31 is provided with a feeding port 32, the lower end of the feeding port 32 is fixedly installed with a sorting device 33, and the collecting tank 34 is welded on the right side of the housing 31 At the lower end, the left end of the collection tank 34 is p...

Embodiment 2

[0029] as attached Figure 5 to attach Figure 7 Shown:

[0030]Wherein, the adjustment device 35 includes a test device 351, a connecting plate 352, an arrangement frame 353, a tiling device 354, and a transmission belt 355. The test device 351 is welded on the lower surface of the connecting plate 352. The arrangement frame 353 is provided with the arrangement frame 353 at the left end of the tiling device 354, and the tiling device 354 is installed on the upper end of the transmission belt 355, and the test device 351 is provided on the upper right end of the transmission belt 355.

[0031] Wherein, the test device 351 includes a linkage rod 51a, a sliding block 51b, a chute 51c, a movement groove 51d, a movement shaft 51e, a measuring rod 51f, and a test rod 51g, and the left end of the linkage rod 51a is fixedly connected to the measuring rod 51f. At the middle end, the sliding block 51b is movably engaged with the chute 51c, the moving groove 51d is movably engaged wit...

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PUM

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Abstract

The invention discloses an integrated circuit electronic component testing system which structurally comprises a material outlet, a top cover, a processing device and a bottom plate, wherein the material outlet is fixedly embedded in the surface of the front end of the processing device, the top cover is welded to the surface of the upper end of the processing device, and the material outlet is formed in the upper end of the bottom plate. Electronic components enter the processing device from a feeding port before being tested, and the electronic components move through a conveying belt, so that the electronic components can quickly pass through an opening in a processing groove to enter a separating plate at the lower end; when the electronic components fall onto the separating plate, the components which cannot pass slide rightwards along the separating plate to enter a collecting groove; when the electronic components fall to the lower end of the interior of the processing device from a sorting device, the stacked electronic components are pushed to be flat under the movement of a push plate; when the electronic components pass through an arrangement frame, the electronic components can only pass through the arrangement frame one by one; and measuring rods conduct size fixation on the components, so that testing rods can be adjusted along with the movement of the measuring rods when the electronic components are tested.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, and more specifically relates to a testing system for integrated circuit electronic components. Background technique [0002] Electronic components are components of electronic components and small machines and instruments. They are often composed of several parts and can be used in similar products. They often refer to certain parts in industries such as electrical appliances, radios, and instruments. Electronic components are used in After the factory produces and processes, its electrical performance parameters need to be tested to ensure the safety and stability of the electronic components. However, after the electronic components are soldered on the circuit board, they need to be tested manually. Due to the small area, it takes a lot of time It takes a lot of time to test and test it, which cannot meet the market's production demand for electronic components, and because electronic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/06B07C5/02B07C5/38G01R31/01G01R1/04
CPCB07C5/06B07C5/02B07C5/38G01R31/01G01R1/0408
Inventor 王晓龙
Owner 王晓龙
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