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High-precision evaluation method and circuit suitable for ldo dynamic load response

A dynamic load, high-precision technology, applied in circuit devices, battery load switching, battery circuit devices, etc., can solve the problems of lack of practical test methods, difficulty in meeting test requirements, etc., to achieve controllable test process, improve efficiency and reliability. sexual effect

Active Publication Date: 2022-07-29
WUXI ETEK MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, for the dynamic load response of LDO, there is a lack of test methods with strong practicability, high reliability and good testability, and it is difficult to meet the test requirements in production.

Method used

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  • High-precision evaluation method and circuit suitable for ldo dynamic load response
  • High-precision evaluation method and circuit suitable for ldo dynamic load response
  • High-precision evaluation method and circuit suitable for ldo dynamic load response

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Embodiment Construction

[0033] The present invention will be further described below with reference to the specific drawings and embodiments.

[0034] In order to effectively realize the dynamic load response test of the LDO and improve the efficiency and controllability of the test, the present invention includes an LDO circuit 1 to be tested and a test load circuit adapted to connect with the output end of the LDO circuit 1 to be tested, and further It includes a load dynamic switching control circuit 8 that is adapted and connected to the test load circuit. Through the load dynamic switching control circuit 8, the load state loaded to the output end of the LDO circuit 1 to be tested through the test load circuit can be in a light load state and a heavy load state. In the cyclic switching process, until the dynamic load response of the LDO circuit 1 to be tested is obtained by measurement.

[0035]Specifically, the LDO circuit 1 to be tested may specifically adopt the existing commonly used LDO cir...

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Abstract

The invention relates to a test method and circuit, in particular to a high-precision evaluation method and circuit suitable for LDO dynamic load response. According to the technical solution provided by the present invention, the test method for LDO dynamic load response test includes an LDO circuit to be tested, a test load circuit adapted to connect with the output end of the LDO circuit to be tested, and a test load circuit connected to the test load. The load dynamic switching control circuit connected by the circuit adaptation, through the load dynamic switching control circuit, can make the load state loaded to the output terminal of the LDO circuit to be tested through the test load circuit in the process of cyclic switching between the light load state and the heavy load state, until the measurement results are obtained. Describe the dynamic load response of the LDO circuit under test. The invention can effectively realize the dynamic load response test of the LDO, the test process is controllable, and the test efficiency and reliability are improved.

Description

technical field [0001] The invention relates to a test method and circuit, in particular to a high-precision evaluation method and circuit suitable for LDO dynamic load response. Background technique [0002] LDO (Linear Regulator) is the most widely used power management circuit in the market, and one of its core parameters is dynamic load response. The dynamic load response of the LDO generally needs to be obtained by testing. At present, for the dynamic load response of LDO, there is a lack of test methods with strong practicability, high reliability and good testability, and it is difficult to meet the test requirements in production. SUMMARY OF THE INVENTION [0003] The purpose of the present invention is to overcome the deficiencies in the prior art, and provide a high-precision evaluation method and circuit suitable for LDO dynamic load response, which can effectively realize the dynamic load response test of LDO, the test process is controllable, and the test is ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00H02J7/00
CPCG01R31/00H02J7/0068H02J7/0029
Inventor 汪芳吴鹤松石波史良俊
Owner WUXI ETEK MICROELECTRONICS