Integrated circuit test equipment

A technology for testing equipment and integrated circuits, which is used in electronic circuit testing, components of electrical measuring instruments, and measuring electricity, etc., and can solve the problem of difficult test heads, damage to test points of integrated circuit boards, and deviation of inclination angles of integrated circuit board testing equipment. and other problems to achieve the effect of preventing damage and avoiding damage

Inactive Publication Date: 2021-12-03
谢俊娅
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Integrated circuit testing is the detection of integrated circuits or modules, by measuring the output response of the integrated circuit and comparing the expected output to determine or evaluate the function and performance of inherited circuit components, applying the test input to the device under test, and Analyze the correctness of its output, but because in the process of testing the integrated circuit, the integrated circuit board must first be placed on the test equipment, and the test equipment is not effective in fixing the four corners of the integrated circuit board. During the process, the integrated circuit board is prone to tilt angle deviation inside the test equipment, which makes it difficult for the test head to accurately align the test points on the integrated circuit board, and the test head is in the process of falling and collision detection on the integrated circuit board , it is easy to apply excessive resistance to the test points on the integrated circuit board, and it is easy to cause damage to the test points on the integrated circuit board

Method used

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  • Integrated circuit test equipment
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Examples

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Embodiment 1

[0022] as attached figure 1 to attach Figure 4 Shown:

[0023] The present invention is a kind of integrated circuit test equipment, and its structure comprises console 1, box door 2, guard board 3, test main frame 4, described console 1 front face is installed with cabinet door 2, and console 1 is welded with Shield 3, the test host 4 is located in the middle of the upper end face of the console 1, and the test host 4 includes an electric control console 41, a clamp mechanism 42, a lowering mechanism 43, a push plate 44, a support plate 45, and a cylinder 46. The bottom of the electric console 41 is fixedly installed in the middle of the upper end surface of the console 1, and the clamp mechanism 42 is embedded and installed on the upper end surface of the electric console 41, and the lower end of the lowering mechanism 43 is fixedly installed on the upper end surface of the electric console 41. The middle end of the lowering mechanism 43 is fixed inside the outer end of t...

Embodiment 2

[0029] as attached Figure 5 to attach Figure 7 Shown:

[0030] Wherein, the descending mechanism 43 includes a test mechanism 431, a corrugated plate 432, a data line 433, and a buffer mechanism 434. The corrugated plate 432 is fixedly installed on the top of the test mechanism 431, and the upper end of the corrugated plate 432 is fixed to the bottom of the push plate 44. The data line 433 is electrically connected to the inside of the test mechanism 431, the buffer mechanism 434 is located at the outer end of the test mechanism 431, the bottom of the buffer mechanism 434 is fixed to the outer side of the upper end surface of the electric console 41, and the folded plate 432 is made of rubber The material has a certain degree of resilience, which is beneficial to play a buffering role when the pushing plate 44 exerts a downward force on the testing mechanism 431 .

[0031] Wherein, the test mechanism 431 includes a detection head 31a, a conduction plate 31b, a pipe sleeve 31...

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Abstract

The invention discloses integrated circuit test equipment which structurally comprises an operation table, a box door, a protective plate and a test host, wherein the box door is installed on the front end face of the operation table, the protective plate is welded to the outer side of the upper end face of the operation table, and four corners of an integrated circuit board are firmly clamped by corner clamping plates through resilience force applied by springs in spring pipe sleeves; angle deviation of the integrated circuit board after the integrated circuit board is placed in the placing groove is avoided, the abutting pieces elastically abut against the periphery of the outer side of the integrated circuit board, the integrated circuit board is prevented from being damaged in the testing process, guide descending is conducted on the guide rod through the guide sleeve, the adjusting rod elastically buffers in the guide sleeve, a contact head abuts against the test point on the integrated circuit board, the conducting strip elastically deforms in the pipe sleeve, the conducting strip keeps conductivity in the elastic deformation process, and the test point on the integrated circuit board is prevented from being damaged.

Description

technical field [0001] The present invention relates to the technical field of integrated circuit testing, and more specifically, relates to an integrated circuit testing device. Background technique [0002] Integrated circuit testing is the detection of integrated circuits or modules, by measuring the output response of the integrated circuit and comparing the expected output to determine or evaluate the function and performance of inherited circuit components, applying the test input to the device under test, and Analyze the correctness of its output, but because in the process of testing the integrated circuit, the integrated circuit board must first be placed on the test equipment, and the test equipment is not effective in fixing the four corners of the integrated circuit board. During the process, the integrated circuit board is prone to tilt angle deviation inside the test equipment, which makes it difficult for the test head to accurately align the test points on th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04G01R1/02
CPCG01R31/2886G01R1/04G01R1/02
Inventor 谢俊娅
Owner 谢俊娅
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