Method for testing high and low temperature Smith chart by network analyzer based on labview programming

Abstract

The invention discloses a method for testing a high and low temperature Smith chart by a network analyzer based on labview programming, and the method comprises the following steps: step 1, electrifying equipment to be tested, placing the equipment to be tested in an incubator, connecting a network port of the equipment to be tested to an Ethernet S11 test clamp outside the incubator through a network cable, setting the network port of the to-be-tested equipment to be in a gigabit Ethernet test mode 4, opening the mode 4, and sending the waveform of the mode 4 continuously; step 2, connecting a computer provided with a labview program to a serial port and a network port corresponding to the incubator and the network analyzer through a serial port and a network port respectively to complete physical connection of the test scheme; and step 3, running the written labview program to automatically complete temperature box setting, network analyzer setting and table writing so as to automatically generate a report. The method can be adapted to various different to-be-tested devices, is used for automatically completing the high and low temperature Smith chart test of the to-be-tested device network port, saves time, improves efficiency, and reduces test labor cost.

Description

technical field [0001] The invention relates to the technical field of automated testing, in particular to a method for implementing a network analyzer to test high and low temperature Smith charts based on labview programming. Background technique [0002] The Smith chart is a measure used to measure the relationship between impedance and frequency in the frequency domain. The closer the S11 (return loss) impedance is to 100 ohms, the better the signal quality is. However, general tests are based on normal temperature and cannot be found The relationship between impedance and frequency under the S11 (return loss) Smith chart of the product at high temperature or low temperature, and the network analyzer is manually operated, with low efficiency and high labor costs. Contents of the invention [0003] The object of the present invention is to provide a method for testing high and low temperature Smith charts of network analyzers based on labview programming to address the ...

AI Technical Summary

Problems solved by technology

[0002] The Smith chart is a measure used to measure the relationship between impedance and frequency in the frequency domain. The closer the S11 (return loss) impedance is to 100 ohms, the better the signal quality is. However, general tests are based on normal temperature and cannot be found The relationship between impedance and frequency under the S11 (return loss) Smith chart of the product at high temperature or low temperature, and the network analyzer is manually operated, with low efficiency and high labor costs

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