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Photovoltaic integrated circuit board durability test device

A technology for integrated circuit boards and testing equipment, which is applied in the field of photovoltaic integrated circuit board durability test equipment, can solve the problems of inconvenient fixing integrated circuit boards, and achieve the effects of easy docking, improved functionality, and convenient movement

Inactive Publication Date: 2021-12-21
绍兴华创光电科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The object of the present invention is to provide a kind of test equipment for the durability of integrated circuit boards used in photovoltaics, to solve the problem that it is not convenient to fix the integrated circuit boards in the above-mentioned background technology

Method used

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  • Photovoltaic integrated circuit board durability test device
  • Photovoltaic integrated circuit board durability test device
  • Photovoltaic integrated circuit board durability test device

Examples

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Embodiment Construction

[0029] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0030] In the description of the present invention, it should be noted that unless otherwise specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection. Connected, or integrally connected; it may be mechanically connected...

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Abstract

A photovoltaic integrated circuit board durability test device disclosed by the present invention comprises a shell, a workbench and an upper plate, a control panel is installed in the shell, the workbench is installed at the top end of the shell, a placement plate is installed at the top end of the workbench, and the upper plate is arranged at the top end of the placement plate, the fixing structure comprises sliding grooves, supporting columns, a connecting plate, a pull rod, a compression spring, a pressing plate and sliding blocks, the sliding grooves are fixed to the two sides of the top end of the workbench, and the sliding blocks are installed in the sliding grooves. A pull rod is pulled to drive a pressing plate to move, a compression spring is extruded, a supporting column is pushed to convey the pressing plate to the top end of a circuit board, the pull rod is loosened, the compression spring pushes the pressing plate to press an integrated circuit board, the integrated circuit board is prevented from moving, and therefore the convenient fixing function of the device is achieved, and the placement position of the integrated circuit board is fixed, so that the pins can be conveniently butted with the integrated circuit board, and the functionality of the device is improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to an integrated circuit board durability testing device for photovoltaics. Background technique [0002] The integrated circuit board is a new type of electronic component, which has the advantages of small size, light weight, few lead wires and welding points, long life, high reliability, good performance, etc., so it is widely used in various electrical appliances, and the integration of photovoltaic Before the circuit board leaves the factory, it is necessary to use photovoltaic integrated circuit board durability test equipment to test the photovoltaic integrated circuit board to judge the service life of the photovoltaic integrated circuit board; [0003] China Patent Authorization Announcement No. CN210222193U, announced on March 31, 2020, discloses a batch testing device for the electrical performance of modular integrated circuit boards, including a rack,...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R1/02G01R1/04B25H1/08
CPCG01R31/2851G01R1/02G01R1/0408B25H1/08
Inventor 刘一锋
Owner 绍兴华创光电科技有限公司