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Normal incidence photodetector with self-test functionality

A technology of photodetectors and optical transceivers, which is applied in the field of photodetectors and can solve the problems that cannot be realized at the same time

Pending Publication Date: 2021-12-31
OPENLIGHT PHOTONICS INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Thus, when choosing a photodetector type, PIC designers have presented a choice between low insertion loss on the one hand and self-test functionality on the other, but have not yet been able to achieve both

Method used

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  • Normal incidence photodetector with self-test functionality
  • Normal incidence photodetector with self-test functionality
  • Normal incidence photodetector with self-test functionality

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Embodiment Construction

[0017] Disclosed herein are NIPD structures configured to allow both in-plane and normal incidence detection, which facilitates self-testing while maintaining the low insertion loss associated with conventional NIPDs for normal operation. Optical transceivers incorporating such NIPD structures are also described, along with methods of calibrating and testing the transceivers during production. According to various embodiments, NIPD is implemented in a heterogeneous material platform that integrates III-V materials (i.e., compound semiconductors made from combinations of III and V elements) with silicon photonic devices, Enables high-volume production in standard silicon fabrication plants. NIPDs according to the invention may include, for example, p-i-n "mesas" (flat, table-like structures) made of III-V materials in which high-speed electrical connections are bonded to a patterned semiconductor (e.g., silicon-based) wafer , where waveguides formed in the semiconductor (eg, s...

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Abstract

The embodiment of the invention relates to a normal incidence photodetector with self-test functionality. Photonically integrated normal incidence photodetectors (NIPDs) and associated in-plane waveguide structures optically coupled to the NIPDs can be configured to allow for both in-plane and normal-incidence detection. In photonic circuits with light-generation capabilities, such as integrated optical transceivers, the ability of the NIPDs to detect in-plane light is used, in accordance with some embodiments, to provide self-test functionality.

Description

[0001] This application is a divisional application of an application with an application date of June 28, 2019, an application number of 201910576406.7, and an invention titled "Orthogonal Incidence Photodetector with Self-Test Functionality". technical field [0002] The present disclosure relates generally to photonic integrated circuits (PICs), and in particular to optical transceivers and photodetectors utilized therein. Background technique [0003] In semiconductor-based integrated photonic devices, normal-incidence photodetectors (NIPDs) measure light incident on the detector orthogonal to the plane of the wafer, while waveguide-based photodetectors (WGPDs) capture light that has been fabricated on the wafer surface by An in-plane waveguide routes the light to the detector. To detect external optical signals, for example from optical fibers, in the former case the external light is coupled directly into the NIPD and in the latter case the external light is coupled in...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/0232H01L31/0224H01L31/105G02B6/12G02B6/42H04B10/073H04B10/077H04B10/40
CPCH01L31/105H01L31/02327H04B10/40H01L31/022416G02B6/4214G02B6/12004G02B6/12G02B6/4215G02B6/4286H04B10/0731H04B10/0775G02B2006/12123G02B2006/12061G02B2006/1215G02B2006/12164G02B2006/12078G02B2006/121G02B2006/12121G02B2006/12145H01L31/0304H01L31/0352
Inventor J·帕克B·R·科赫G·A·菲什H·帕克
Owner OPENLIGHT PHOTONICS INC
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