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Wavelength selection method during visible light heat reflection temperature measurement and terminal

A technology of wavelength selection and heat reflection, applied in the direction of electric radiation detectors, etc., can solve the problems of long time consumption and inaccuracy, and achieve the effects of reducing time consumption, improving efficiency and low energy

Pending Publication Date: 2022-01-14
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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  • Application Information

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Problems solved by technology

[0006] Embodiments of the present invention provide a wavelength selection method and a terminal for visible light heat reflection temperature measurement to solve the problems in the prior art that the wavelength selection method for visible light heat reflection temperature measurement takes a long time and is not accurate enough

Method used

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  • Wavelength selection method during visible light heat reflection temperature measurement and terminal
  • Wavelength selection method during visible light heat reflection temperature measurement and terminal
  • Wavelength selection method during visible light heat reflection temperature measurement and terminal

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Embodiment Construction

[0045] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.

[0046] In order to make the purpose, technical solution and advantages of the present invention clearer, specific embodiments will be described below in conjunction with the accompanying drawings.

[0047] In existing reports, the change of reflectivity with temperature can be expressed by formula (1):

[0048]

[0049] Among them, ΔR is the change of reflectivity; R average is the average va...

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Abstract

The invention provides a wavelength selection method during visible light heat reflection temperature measurement and a terminal. The method comprises the following steps of applying a preset pulse modulation signal to a measured piece under the irradiation of a light source with a wavelength in a preset wavelength range, after a first preset time interval, respectively obtaining a first reflectivity of the measured piece at a high level and a second reflectivity of the measured piece at a low level of the preset pulse modulation signal, changing the wavelength of the light source for multiple times in a preset wavelength range to obtain a first reflectivity at a high level and a second reflectivity at a low level corresponding to each wavelength, and according to the first reflectivity and the second reflectivity corresponding to each wavelength in the preset wavelength range, selecting the wavelength of the measured piece during temperature measurement. The time consumption of the wavelength selection method during visible light heat reflection temperature measurement can be reduced, the efficiency of the wavelength selection method during visible light heat reflection temperature measurement is improved, and the wavelength selection accuracy during visible light heat reflection temperature measurement is improved.

Description

technical field [0001] The invention relates to the technical field of visible light heat reflection temperature measurement, in particular to a wavelength selection method and a terminal for visible light heat reflection temperature measurement. Background technique [0002] Visible light heat reflection temperature measurement technology is based on visible light heat reflection phenomenon. The basic feature of visible light heat reflection phenomenon is that when visible light is irradiated on the surface of a certain material, the reflectivity of the material to visible light changes with the temperature of the material. In the existing reports, the change of reflectivity with temperature can be considered to be linear, so it can be characterized by a change rate coefficient, which is usually called thermal reflectance calibration coefficient C in the literature TR . [0003] Among them, the thermal reflectance calibration coefficient C TR The value is generally in (10...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/10
CPCG01J5/10
Inventor 翟玉卫吴爱华王维丁晨李灏荆晓冬丁立强乔玉娥
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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