Circuit dynamic voltage drop detection method, device, electronic equipment and storage medium

Abstract

The invention discloses a circuit dynamic voltage drop detection method, a device, electronic equipment and a computer readable storage medium. The method comprises the steps of determining a target circuit needing to be detected; determining end points of all the time sequence paths in the target circuit, and counting the number of starting points and the number of logic gates corresponding to each end point; determining a starting point number reference value and a logic gate number reference value; and if the starting point number corresponding to the target end point is greater than the starting point number reference value or the logic gate number is greater than the logic gate number reference value, determining that the dynamic voltage drop risk exists in the time sequence path corresponding to the target end point. According to the invention, the detection of the dynamic voltage drop is realized before the back-end realization, and the accuracy of the detection of the dynamic voltage drop is improved.

Description

technical field [0001] The present application relates to the field of computer technology, and more specifically, to a method and device for detecting a dynamic voltage drop of a circuit, an electronic device, and a computer-readable storage medium. Background technique [0002] The role of the chip power grid is to provide sufficient voltage and current to the components inside the chip. In the ultra-deep sub-micron stage, the operating frequency of the chip is getting higher and higher, the metal connection is getting thinner, and the working voltage is getting lower and lower, which makes the impact of the voltage drop (IR-drop) of the power network on the chip cannot be ignored. ignore. Dynamic IR-drop is the voltage drop caused by the current fluctuation of the power supply when the circuit switch is switched. [0003] In related technologies, a method for detecting dynamic IR-drop is to manually input an estimated flip rate before the back-end implementation is comp...

AI Technical Summary

Problems solved by technology

However, since the back-end implementation is basically completed, if a problem is found, it is difficult to find a way to modify it from the root cause, that is, the front-end design. Instead, we can only do some remedial methods on the back-end design, and sometimes it cannot meet the design requirements.

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