Electric connector damage degree characterization method based on S parameter Nyquist diagram

Abstract

The invention provides an electric connector damage degree characterization method based on an S parameter Nyquist diagram, and the method comprises the steps: selecting an electric connector, carrying out the laboratory contrast test of different damage degrees for the electric connector, carrying out the S parameter test of the electric connector under different damage degree grades according to the frequency range specified by the electric connector, determining the test frequency range of the electric connector under different damage degree grades, carrying out S parameter test on the electric connector with different damage degrees in the test frequency range, converting the S parameter into a Nyquist diagram, and judging the damage degree condition of the electric connector according to the change rule of the S parameter Nyquist diagram of the electric connector. According to the invention, the electric connector does not need to be disassembled, the surface state of the contact end face of the contact piece in the electric connector does not need to be damaged, the performance change signal of the electric connector can be captured at the initial stage of performance degradation of the contact piece of the electric connector, the testing means are more sensitive, and the testing result is more accurate.

Description

technical field [0001] The invention belongs to the technical field of electrical connector detection, and in particular relates to a damage degree characterization method of an electrical connector based on an S-parameter Nyquist diagram. Background technique [0002] At present, the degradation behavior and failure phenomena of electrical connectors are generally achieved through various material-level microscopic tests on key structures, such as scanning electron microscopes and energy spectrum analyzers. The electrical connectors need to be disassembled. Direct is also more accurate, but electrical connector separation and disassembly still has an impact on critical structural states. For example, the influence of redundant objects is not easy to be observed after disassembly, and the actual contact position is also difficult to recover after separation, which will have an adverse effect on the analysis results of fault-sensitive structures. [0003] At present, the ele...

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Problems solved by technology

[0002] At present, the degradation behavior and failure phenomena of electrical connectors are generally achieved through various material-level microscopic tests on key structures, such as scanning electron microscopes and energy spectrum analyzers. The electrical connectors need to be disassembled. Direct and more accurate, but electrical connector separation and disassembly still has an impact on critical structural states

For example, the influence of redundant objects is not easy to be observed after dismantling, and the actual contact position is also difficult to restore after separation, which will adversely affect the analysis results of fault-sensitive structures

[0003] At present, the electrical contact degradation state of the conductor in the electrical connector is mostly characterized by the change law of the contact resistance, and there are basically few related studies that are characterized by the Nyquist diagram of the S parameter.

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