Passive crystal oscillator test circuit
A passive crystal oscillator and testing circuit technology, which can be used in the direction of measuring electricity, measuring electrical variables, and testing a single semiconductor device, and can solve problems such as errors
Active Publication Date: 2022-02-08
深圳佑驾创新科技股份有限公司
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Problems solved by technology
[0002] When designing and selecting hardware, the indicators and performance parameters of the passive crystal oscillator depend on the product specification. However, in actual situations, the performance of the passive crystal oscillator is often different from the product specification. The performance parameters of the source crystal oscillator may have certain errors
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[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0026] see figure 1 , a passive crystal oscillator test circuit provided by an embodiment of the present invention, comprising: an oscillator drive module 2, a crystal oscillator oscillator module 1, and an oscillator signal output module 3;
[0027] The start-up drive module 2 includes a drive chip U1; the crystal oscillator start-up module 1 includes: a first capacitor C1, a second capacitor C2, a passive crystal oscillator Y1 to be tested, and a first resistor R...
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The invention discloses a passive crystal oscillator test circuit which comprises an oscillation starting driving module, a crystal oscillator oscillation starting module and an oscillation starting signal output module. The oscillation starting driving module comprises a driving chip. The crystal oscillator oscillation starting module comprises a first capacitor, a second capacitor, a passive crystal oscillator to be tested and a first resistor. The signal input end of the passive crystal oscillator to be tested is connected with a first end of the first resistor, the signal output end is connected with a passive crystal oscillator signal input end of the driving chip, and the grounding end is grounded. A second end of the first resistor is connected with a passive crystal oscillator signal output end of the driving chip, and the first resistor is externally connected with a current testing device. A first end of the first capacitor is grounded, and a second end is connected with the signal output end of the passive crystal oscillator to be tested. A first end of the second capacitor is grounded, and a second end is connected with the first end of the first resistor. The oscillation starting signal output end of the driving chip is connected with an oscillation starting signal output module, and the oscillation starting signal output module is externally connected with an oscilloscope. According to the invention, the performance parameters of a passive crystal oscillator can be tested.
Description
technical field [0001] The invention relates to the technical field of electronic circuits, in particular to a passive crystal oscillator test circuit. Background technique [0002] When designing and selecting hardware, the indicators and performance parameters of the passive crystal oscillator depend on the product specification. However, in actual situations, the performance of the passive crystal oscillator is often different from the product specification. There may be certain errors in the performance parameters of the source crystal oscillator. Contents of the invention [0003] The embodiment of the present invention provides a passive crystal oscillator test circuit, which can realize the test of the performance parameters of the passive crystal oscillator. [0004] A passive crystal oscillator test circuit according to an embodiment of the present invention includes: an oscillation start-up drive module, a crystal oscillator start-up module, and an oscillation s...
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Login to View More IPC IPC(8): G01R31/26
CPCG01R31/2637
Inventor 钱航刘国清杨广王启程聂晓楠谭开荣胡帅王军
Owner 深圳佑驾创新科技股份有限公司