Clock monitoring circuit

Abstract

The present disclosure relates to a monitoring circuit comprising a clock generator adapted to generate a first clock having a first target frequency; a code generator suitable for generating an output code by changing a value of the input code in response to an input clock, receiving a feedback signal associated with the output code, and changing the value of the input code by performing a setting operation in a first mode and an inverse setting operation in a second mode; and an operation controller suitable for transmitting the first clock and the start code as an input clock and an input code when entering the first mode, setting the output code as a count code when exiting the first mode, transmitting the second clock and the count code as the input clock and the input code when entering the second mode, and counting the number of triggers of the second clock in the second mode until the output code has the same value as the value of the start code to generate the monitoring information.

Description

[0001] Cross References to Related Applications [0002] This application claims priority from Korean Patent Application No. 10-2020-0103792 filed on August 19, 2020, which is hereby incorporated by reference in its entirety. technical field [0003] Embodiments relate to a semiconductor design technique, and more particularly, to a clock monitoring circuit used in a semiconductor device. Background technique [0004] As VLSI process technology improves, semiconductor circuits are more affected by process, voltage, and temperature (PVT) variations. [0005] In particular, a clock generating circuit such as a ring oscillator for generating a clock within a semiconductor device may be significantly affected by such PVT variation. That is, in order to generate a clock set to a specific target frequency, a ring oscillator included in a semiconductor device may generate a clock having a significant frequency difference from the specific target frequency according to PVT variatio...

AI Technical Summary

Problems solved by technology

However, the method of counting the divided clock may have many errors in the measurement compared to the method of directly counting the clock generated by the ring oscillator

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