Abnormality detection method and system for underlying hardware of intelligent equipment
A low-level hardware and smart device technology, applied in hardware monitoring, error detection/correction, instruments, etc., can solve the problems of VTM self-service equipment detection and self-inspection mechanism, poor management, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0031] Such as figure 1 with figure 2 As shown in FIG. 2 , it is a schematic diagram of an embodiment of an abnormality detection method for the underlying hardware of a smart device provided by the present invention. In this embodiment, the method includes:
[0032] The middleware responds to receiving the self-test instruction from the client, and obtains the current state information of the underlying hardware of the smart device; that is, when the device is powered on and running, the middleware initiates the underlying hardware self-test task through the middleware, and the middleware (middle platform microservice) After initiating the self-test task, the self-test driver at the bottom of the device obtains the current status information of each hardware m...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com