Abnormality detection method and system for underlying hardware of intelligent equipment
A low-level hardware and smart device technology, applied in hardware monitoring, error detection/correction, instruments, etc., can solve the problems of VTM self-service equipment detection and self-inspection mechanism, poor management, etc.
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[0030] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0031] Such as figure 1 with figure 2 As shown in FIG. 2 , it is a schematic diagram of an embodiment of an abnormality detection method for the underlying hardware of a smart device provided by the present invention. In this embodiment, the method includes:
[0032] The middleware responds to receiving the self-test instruction from the client, and obtains the current state information of the underlying hardware of the smart device; that is, when the device is powered on and running, the middleware initiates the underlying hardware self-test task through the middleware, and the middleware (middle platform microservice) After initiating the self-test task, the self-test driver at the bottom of the device obtains the current status information of each hardware m...
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