X-ray flaw detection intelligent detection method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 上海锲孚智能科技有限公司
- Publication Date
- 2022-03-01
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Abstract
Description
technical field
[0001] The invention relates to X-ray non-destructive testing and image intelligent recognition, in particular to an intelligent detection method for X-ray flaw detection. Background technique
[0002] Due to the influence of factors such as different environmental conditions and welding processes, various defects (such as: cracks, pores, incomplete fusion, incomplete penetration, slag inclusions, etc.) will inevitably appear during the welding process, and due to the nature of the defects Some defects in the principle of radiography and radiography are relatively difficult to find, which makes the entire flaw detection process more complicated and makes film evaluation more difficult. These defects directly endanger the quality of welded products, and have a great impact on the safety and performance of welded structures.
[0003] At present, the commonly used non-destructive testing methods mainly include ultrasonic, magnetic particle, ray, etc. Among them...