High and low temperature test box capable of simulating atmospheric temperature change for instrument detection

Abstract

The invention provides a high and low temperature test box capable of simulating atmospheric temperature change for instrument detection, and relates to the technical field of instrument detection. The instrument detection high and low temperature test box capable of simulating the atmospheric temperature change comprises a test box, a sealing door, a handle, a control center, a filtering mechanism and a buffer mechanism, the sealing door is rotatably connected to the front side of the test box close to the top end, the handle is fixedly connected to the right side of the sealing door, and the control center is fixedly connected to the front side of the test box on the right side of the handle; the bottom end of the test box is fixedly connected with a filter mechanism, a buffer mechanism is arranged in the part between the test box and the sealing door, and the buffer mechanism prevents internal hot air from being sprayed out to scald workers when the sealing door is opened. The problem that the instrument detection result of the high and low temperature test box is affected by high air humidity and excessive dust in the air is solved.

Description

technical field [0001] The invention relates to the technical field of instrument detection, in particular to a high and low temperature test box for instrument detection that can simulate atmospheric temperature changes. Background technique [0002] The high and low temperature test chamber is used for high temperature and low temperature reliability tests of industrial products. It is used to test the performance of parts and materials of related products such as electronics, automobiles, aerospace and other related products under the condition of high temperature and low temperature alternating cycles. index. [0003] The high and low temperature test chamber needs to circulate the air of the compressor to cool the test chamber during the working process. If the air outside the test chamber is too humid or contains a lot of dust, it will affect the normal operation of the compressor and affect the test. The normal operation of the tank affects the results of instrument ...

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Problems solved by technology

[0005] Aiming at the deficiencies of the prior art, the present invention provides a high and low temperature test chamber for instrument detection that can simulate changes in atmospheric temperature, which solves the problem that high air humidity and excessive dust in the air affect the detection results of the instrument by the high and low temperature test chamber. The problem

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