High-reflection part measurement method and system based on improved Phong model
A measurement method and high-reflection technology, applied in the field of measuring instruments, to achieve the effect of improving extraction accuracy, improving precision, and avoiding high-reflection phenomena
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[0055] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings.
[0056] figure 1 It is the overall structural diagram of the present invention, such as figure 1 As shown, the system device applied by the present invention includes an operating platform (not shown in the figure), on which the first industrial robot 1, the second industrial robot 4, the part to be tested 5 are placed, and the first industrial robot 1 end effector A wired structured light laser 2 is connected to the top, and an area-array industrial camera 3 is connected to the end effector of the second industrial robot 4; the first industrial robot 1 has 6 degrees of freedom and can control the linear structured light laser 2 to move in any space. The industrial robot 4 has 6 degrees of freedom, and controls the area array industrial camera 3 to perform any industrial camera movement in any space;
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