Testing device

Abstract

The invention discloses a testing device, which comprises a box body, a conductive assembly arranged on the upper side of the box body, a circuit board for testing, a tray, a linear guide mechanism and a pressing assembly, and is characterized in that the tray is arranged on the box body and is used for placing a tested integrated circuit; the conductive assembly is arranged on the lower side of the tray and is used for electrically connecting the tested integrated circuit with the test circuit board; the downward pressing assembly comprises a mounting plate, a pressing block and a downward pressing piece, the mounting plate is mounted on the box body through a linear guide mechanism, so that the downward pressing assembly can translate back and forth between an opening taking and placing position and a closing testing position along the linear guide mechanism, and the pressing block is mounted on the lower side of the mounting plate in an up-down floating manner; by rotating the pressing piece, the pressing block can be pressed at the closed test position, so that the pressing block can tightly press the tested integrated circuit, or the pressing block can be released to return to the initial position. According to the invention, the test efficiency and accuracy can be improved, and the test operation is more convenient.

Description

technical field [0001] The invention relates to the field of electronic testing devices, in particular to a testing device for chips and electronic devices. Background technique [0002] At present, in the chip test on the market, the test seat of the test device is a flip-down pressing structure, which has low work efficiency, and the balance cannot be completely guaranteed during the pressing process, resulting in a high false detection rate. In addition, most of the test devices use single-chip testing. lead to even lower work efficiency. Contents of the invention [0003] The main purpose of the present invention is to provide a testing device, aiming at improving the testing efficiency and accuracy, and making the testing operation more convenient. [0004] In order to achieve the above object, the present invention provides a test device, which includes a box body, a conductive component arranged on the upper side of the box body, a circuit board for testing, a tray...

AI Technical Summary

Problems solved by technology

[0002] At present, in the chip test on the market, the test seat of the test device is a flip-down press structure, which has low work efficiency, and the balance cannot be completely guaranteed during the press-down process, resulting in errors. In addition, most of the test devices use single-chip testing, resulting in even lower work efficiency

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