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Method for adaptively generating ATE test code in EDA simulation

A test code, self-adaptive technology, applied in the field of self-adaptive generation of ATE test code, can solve the problem that there is no way to realize the conversion of bidirectional pin test code

Pending Publication Date: 2022-05-10
58TH RES INST OF CETC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When converting, it is necessary to define whether the pin is input or output under the current function, and this conversion method cannot realize the test code conversion of bidirectional pins under a certain function

Method used

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  • Method for adaptively generating ATE test code in EDA simulation
  • Method for adaptively generating ATE test code in EDA simulation

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Embodiment Construction

[0024] A method for adaptively generating ATE test codes in EDA simulation proposed by the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that all the drawings are in a very simplified form and use imprecise scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.

[0025] The invention provides a method for adaptively generating ATE test codes in EDA simulation, the process of which is as follows figure 1 As shown, it includes the following steps: first, perform ATE test on the circuit under test, then write the pin information file of the circuit under test according to the pins of the circuit under test, and generate the test code by automatically generating the script according to the obtained...

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Abstract

The invention discloses a method for adaptively generating ATE test codes in EDA simulation, and belongs to the field of digital integrated circuit EDA simulation. Carrying out ATE test on the tested circuit; writing a pin information file according to the pin of the tested circuit; generating a test code capture module and an instantiation module by utilizing an automatic generation script according to the pin information file; integrating the instantiated module into an EDA (Electronic Design Automation) simulation platform; according to the method, the corresponding function in the EDA simulation platform is selected for simulation, and the ATE test code is output, so that the test code can be directly generated according to the simulation function in EDA simulation, and extra workload is not needed.

Description

technical field [0001] The invention relates to the technical field of digital integrated circuit EDA simulation, in particular to a method for adaptively generating ATE test codes in EDA simulation. Background technique [0002] With the development of integrated circuits and the application requirements of the current market, the scale of monolithic integrated circuits is increasing, the number of circuit pins is increasing, and the overall function of the circuit is becoming more and more complex. In order to ensure the quality of the circuit and reduce the risk of zero quality caused by failure problems after the product circuit is put into the market, generally before the circuit is put into the market, a relatively complete and complex ATE test will be carried out to ensure the quality of the product. [0003] In order to be able to screen out defective products during the ATE test phase, it is necessary to design a complex ATE test program to ensure that full-node and...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R31/317G01R31/3183G06F30/30
CPCG01R31/2851G01R31/317G01R31/31704G01R31/318307G01R31/31715G06F30/30
Inventor 邵健桂江华胡鹏张磊姜若旭
Owner 58TH RES INST OF CETC
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