Automatic memory chip testing device
A test device and memory chip technology, applied in static memory, error detection/correction, instruments, etc., can solve problems such as low efficiency of manual testing and consumption of labor costs
Pending Publication Date: 2022-05-13
深圳市宏旺微电子有限公司
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Problems solved by technology
[0003] The testing of memory chips in the prior art includes manual testing and automated testing. At present, manual testing occupies the mainstream of testing, but the efficiency of manual testing is low, and a large number of professional testers need to be trained, which consumes relatively high labor costs.
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[0032] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0033] In order to better illustrate this embodiment, some parts in the drawings will be omitted, enlarged or reduced, and do not represent the size of the actual product; for those skilled in the art, the omission of some known structures and their descriptions in the drawings is understandable. The same or similar reference numerals correspond to the same or similar components.
[0034] In the prior art, the testing of memory chips (such as memory chips) is still dominated by manual testing. No matter in which field, manual operation means low efficiency and high cost (for example, it is necessary to train a large number of professional testers, and the labor cost consumption is relatively high). The above-mentioned problems of manual testing in the field of memory chip testing are particularly prominent. Therefore, how to develop an efficient automatic ...
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The invention discloses an automatic memory chip testing device, which comprises a fixed part and a sliding part, the sliding part is movably arranged on the fixed part, the sliding part can keep a horizontal state relative to the fixed part to slide towards the rear upper part or the front lower part, the fixed part comprises a chip testing seat, and the chip testing seat is arranged on the fixed part. The chip testing seat is arranged on the front surface of the fixed part, the sliding part comprises a chip pressing piece, the chip pressing piece is arranged on the front surface of the sliding part, and when the sliding part slides forwards and downwards to a working position, the chip pressing piece is just pressed on the chip testing seat. According to the automatic loading and testing device, automatic opening and closing and automatic loading or unloading of the storage chips can be achieved under driving of the driving air cylinder, after the storage chips are loaded in place, the automatic loading and testing device is closed under driving of the driving air cylinder, and therefore automatic loading and testing of the storage chips are achieved, and the automatic loading and testing device is a key technology for achieving automatic testing of the storage chips.
Description
technical field [0001] The invention relates to the technical field of memory chip testing, in particular to an automatic memory chip testing device. Background technique [0002] IC chip (Integrated Circuit integrated circuit) is a large number of microelectronic components integrated together to form a chip. Memory chips are IC chips with storage functions (such as memory chips, also called "memory particles"). Memory chips are the core components of memory devices. The quality of memory chips can directly affect the performance of memory devices. Chips have a certain defect rate, so memory chips need to be strictly tested before their application. [0003] The testing of memory chips in the prior art includes manual testing and automated testing. At present, manual testing occupies the mainstream of testing, but the efficiency of manual testing is low, and a large number of professional testers need to be trained, which consumes relatively high labor costs. The automate...
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IPC IPC(8): G06F11/273G11C29/08
CPCG06F11/273G11C29/08
Inventor 杨密凯
Owner 深圳市宏旺微电子有限公司