Semiconductor high and low temperature testing device of silicon-based device
A test device, high and low temperature technology, applied in the field of semiconductor high and low temperature test devices, to achieve the effects of reducing frost, reducing water vapor, and high lighting efficiency
Pending Publication Date: 2022-06-07
厦门特仪科技有限公司
View PDF0 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0005] The present invention aims at the frosting problem of semiconductor high and low temperature fixtures for optical testing of existing silicon-based devices, and provides a semiconductor high-low temperature test device for silicon-based devices, which can test silicon-based devices under high and low temperature conditions and improve test efficiency. And simple operation, low equipment cost
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0027] The technical solutions of the present invention will be described below with reference to the accompanying drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0028] It should be noted that the embodiments of the present invention and the features of the embodiments may be combined with each other under the condition of no conflict.
[0029] The present invention will be described in detail below with reference to the accompanying drawings and in conjunction with the embodiments.
[0030] like figure 1 As shown, a semiconductor high and low temperature testing device for silicon-based devices disclosed in the present invention includes a box body 1, a seal...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention provides a semiconductor high and low temperature testing device of a silicon-based device. The semiconductor high and low temperature testing device comprises a box body, a sealing cover and a high and low temperature testing jig arranged in a sealed cavity formed by the box body and the sealing cover. The high and low temperature test fixture comprises a base, a semiconductor high and low temperature block and a test clamping seat which are sequentially arranged from bottom to top; the base is arranged at the bottom of the cavity of the box body, a semiconductor capable of adjusting the temperature is arranged in the semiconductor high and low temperature block, and the test clamping seat is used for installing a silicon-based device to be tested. According to the semiconductor high and low temperature testing device of the silicon-based device, the silicon-based device can be tested under high and low temperature conditions, the testing efficiency is improved, the operation is simple, and the equipment cost is low.
Description
technical field [0001] The invention relates to the technical field of detection of display screens, in particular to a semiconductor high and low temperature testing device for silicon-based devices. Background technique [0002] The high and low temperature test device is a commonly used equipment in the optical performance test of the display screen. When testing the silicon-based device on the display screen, it needs to be tested in a high temperature environment or a low temperature environment to verify the applicability of the display screen. In silicon-based devices, TEG sheets are used to verify the light-emitting material in the display. [0003] Due to the low temperature of silicon-based devices in the conventional environment, the glass surface of the display screen will be fogged and frosted, which will affect the test of optical characteristics. At the same time, silicon-based devices need multi-point probes to be fully lit. [0004] Therefore, there is a ne...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2642
Inventor 吴泽斌林志阳王世锐
Owner 厦门特仪科技有限公司