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Test method, device, equipment and storage medium for memory

A test method and test equipment technology, applied in the field of semiconductors, can solve problems such as incompatibility, and achieve the effect of improving randomness and accuracy

Active Publication Date: 2022-08-05
CHANGXIN MEMORY TECH INC +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although these test tools are highly targeted, they will continuously test the selected memory area in the memory when they start running, but they cannot be combined with actual user behavior.

Method used

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  • Test method, device, equipment and storage medium for memory
  • Test method, device, equipment and storage medium for memory
  • Test method, device, equipment and storage medium for memory

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Embodiment Construction

[0052] In order to make the purposes, technical solutions and advantages of the embodiments of the present disclosure more clear, the technical solutions in the disclosed embodiments will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present disclosure. Obviously, the described embodiments These are some, but not all, embodiments of the present disclosure. Based on the embodiments in the present disclosure, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of the present disclosure. It should be noted that, the embodiments of the present disclosure and the features of the embodiments may be arbitrarily combined with each other under the condition of no conflict.

[0053] File verification is a verification method commonly used in testing to test whether an abnormality occurs in the memory. Commonly used file check algorithms are parity che...

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PUM

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Abstract

The present disclosure provides a testing method, device, device and storage medium for a memory, and relates to the technical field of semiconductors. The method for testing the memory includes: obtaining a first check code of at least one test file; mapping the at least one test file into a memory to generate a map file; after performing a preset test operation on the memory, obtaining a second check code of the map file ; According to the first check code and the second check code, determine the state of the memory. In the solution provided by the embodiments of the present disclosure, by mapping at least one test file into the memory, simulating the application scenario of the memory during use, and then performing a preset test operation on the memory, and comparing the check codes before and after the test operation to determine Whether the memory is abnormal, improve the randomness and accuracy of the test.

Description

technical field [0001] The present disclosure relates to the field of semiconductor technology, and in particular, to a memory testing method, apparatus, device, and storage medium. Background technique [0002] Memory is the most important part of smart devices and computers, and programs in these devices run in memory. Whether it is DDR (Double Data Rate SDRAM (Synchronous Dynamic Random Access Memory), double-rate synchronous dynamic random access memory) or LPDDR (Low Power Double Data Rate SDRAM, low-power memory technology), memory is critical to system performance and stability. It plays a vital role. Therefore, it is necessary to ensure the reliability of the memory used in these devices, and it is necessary to test the memory. [0003] Currently, there are many test tools for memory in the operating system, but the test method of most test tools is to write predetermined data into the memory first, then read the data, and then compare whether it is consistent. Al...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/42G11C11/4078
CPCG11C29/42G11C11/4078
Inventor 杨凯
Owner CHANGXIN MEMORY TECH INC