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Display panel, display panel testing method and display device

A technology of display panel and test module, applied in the field of display device and display panel, can solve the problems of low detection accuracy and the like

Pending Publication Date: 2022-06-17
SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] During the research and practice of the prior art, the inventors of the present application found that the detection accuracy of common detection methods is low

Method used

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  • Display panel, display panel testing method and display device
  • Display panel, display panel testing method and display device
  • Display panel, display panel testing method and display device

Examples

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Embodiment Construction

[0028] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application. In addition, it should be understood that the specific embodiments described herein are only used to illustrate and explain the present application, but not to limit the present application. In this application, unless otherwise stated, the directional words used such as "upper" and "lower" generally refer to the upper and lower sides of the device in actual use or working state, specifically the drawing direction in the accompanying drawings ; while "insid...

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Abstract

The embodiment of the invention discloses a display panel and a display panel testing method. The display device comprises a display panel. The display panel comprises a substrate, a signal line, a first test module and a second test module. The signal line is disposed on the substrate. The signal lines include a plurality of first signal lines and a plurality of second signal lines. The first signal line is connected with the first color pixel. The second signal line is connected with the second color pixel. The first test module is arranged on the substrate and is spaced from the signal line. The first test module is connected with the first signal line and the second signal line. The first test module is connected with the first signal line and the second signal line, so that the first signal line and the second signal line do not need to be tested independently during array test. Therefore, the number of needles inserted into the array detection equipment can be reduced, the alignment requirement of the test needles and the display panel can be reduced, and inaccurate array detection is avoided.

Description

technical field [0001] The present application relates to the field of display technology, and in particular, to a display panel, a display panel testing method, and a display device. Background technique [0002] At present, in the manufacturing process of large-size Active-matrix organic light-emitting semiconductor (AMOLED) panels, there must be a corresponding inspection process after the array module (array) process, the light-emitting module (EL) process, and the packaging process. . At present, there are two common detection methods after the array module process: [0003] The first array test method is to use the full contact (Fullcontact) pin contact method for testing. This detection method has high accuracy, but because each signal line needs to detect the needle connection of the equipment mechanism, it puts forward high requirements on the positioning accuracy of the detection equipment and the mechanism design, and there is still a high risk of missing needle...

Claims

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Application Information

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IPC IPC(8): H01L27/32G09G3/00
CPCG09G3/006H10K59/131H10K71/70H10K59/35H10K59/351G09G2300/0452
Inventor 李东伟
Owner SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD