Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Chip module test fixture and test system

A chip module and test fixture technology, which is applied in radio wave measurement systems, vehicle testing, and machine/structural component testing. The number of cables and the effect of improving the space utilization of the turntable

Pending Publication Date: 2022-07-08
ACEINNA TRANSDUCER SYST CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As the number of product tests increases, the lines will become more complex and messy, causing hidden dangers;
[0005] 2. The space of the turntable equipment is limited, the space utilization rate is not high during the test, and the test efficiency is low

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Chip module test fixture and test system
  • Chip module test fixture and test system
  • Chip module test fixture and test system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] In order to make the above objects, features and advantages of the present invention more clearly understood, the present invention will be described in further detail below with reference to the accompanying drawings and specific embodiments.

[0033] Reference herein to "one embodiment" or "an embodiment" refers to a particular feature, structure, or characteristic that may be included in at least one implementation of the present invention. The appearances of "in one embodiment" in various places in this specification are not all referring to the same embodiment, nor are they separate or selectively mutually exclusive from other embodiments. Unless otherwise specified, the terms connected, connected, and connected herein mean electrically connected, all mean direct or indirect electrical connection.

[0034] In the description of the present invention, it should be understood that the terms "upper", "lower", "left", "right", "top", "bottom", "inner", "outer" and the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a chip module test fixture and a chip module test system. The chip module test fixture comprises a turntable mounting plate; the first PCBA is fixed on the rotary table mounting plate, a plurality of accommodating spaces which are mutually spaced are arranged in the first PCBA, and each accommodating space penetrates through the first PCBA; each second PCBA is located in the corresponding containing space in the first PCBA and fixed to the rotary table mounting plate, and the first PCBA is connected with the second PCBAs; each socket is arranged on the corresponding second PCBA, the sockets are used for bearing a chip module to be tested, and the chip module to be tested is connected with the corresponding second PCBA through the sockets. Compared with the prior art, the jig testing PCBA adopts a split type design, so that the space utilization rate of a rotary table can be improved, and the number of cables for testing can be reduced.

Description

【Technical field】 [0001] The invention relates to the technical field of chip testing, in particular to a chip module testing fixture and a testing system. 【Background technique】 [0002] The IMU / RTK chip modules used in vehicles usually need to perform angular velocity calibration and testing on the turntable equipment. Among them, the full name of IMU is Inertial Measurement Unit, which is inertial measurement unit; the full name of RTK is Real-timekinematic, which is carrier phase difference technology. . [0003] When the existing IMU / RTK chip module is used for small batch turntable test: [0004] 1. Each chip module has interfaces such as power supply, USB (Universal Serial Bus), RF (Radio Frequency, radio frequency), etc. There are many cables during testing. With the increase in the number of product tests, the lines will become more complex and messy, causing hidden dangers; [0005] 2. The space of the turntable equipment is limited. During the test, the space u...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R1/04G01S19/23G01C25/00G01M17/007
CPCG01R1/04G01R1/0416G01C25/005G01S19/235G01M17/007
Inventor 周鹏宇黄劲松
Owner ACEINNA TRANSDUCER SYST CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products