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Software test coverage rate calculation device and method

A test coverage and software testing technology, applied in the field of software test coverage calculation devices, can solve the problems of lack of theoretical basis for randomness and low accuracy, and achieve the effects of high accuracy and improving software test quality.

Pending Publication Date: 2022-07-12
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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AI Technical Summary

Problems solved by technology

Therefore, judging the test coverage rate based on the use case coverage rate is not accurate;
[0005] The method of judging the adequacy of testing based on the number of bugs largely depends on the experience of test managers, which is highly random and lacks theoretical basis

Method used

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  • Software test coverage rate calculation device and method
  • Software test coverage rate calculation device and method
  • Software test coverage rate calculation device and method

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Embodiment Construction

[0044] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the embodiments of the present invention will be further described in detail below with reference to the specific embodiments and the accompanying drawings.

[0045] It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are for the purpose of distinguishing two entities with the same name but not the same or non-identical parameters. It can be seen that "first" and "second" It is only for the convenience of expression and should not be construed as a limitation to the embodiments of the present invention, and subsequent embodiments will not describe them one by one.

[0046] Based on the above purpose, in a first aspect of the embodiments of the present invention, an embodiment of a software test coverage calculation apparatus is provided. like figure 1 As shown, the device specifically includes a...

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Abstract

The invention discloses a software test coverage rate calculation device and method, and the device comprises a defect implantation unit which is configured to implant defects into tested software and construct a defect list based on the implanted defects; the software test coverage rate guarantee system comprises a version management module, an identification module and a coverage rate calculation module, and the version management module is configured to create a test version number and import the test version number into a corresponding defect list; the test unit is configured to test the software to be tested in which the defects are implanted, and the defects occurring in the test process are recorded into the defect management system; the identification module is configured to identify the defects input into the defect management system based on the corresponding defect list; the coverage rate calculation module is configured to calculate a test coverage rate based on the identified defects and the defects in the corresponding defect list. Through the scheme of the invention, the calculation of the software test coverage rate is realized, and the software test quality is improved.

Description

technical field [0001] The invention relates to the technical field of software testing, in particular to a software testing coverage calculation device and method. Background technique [0002] Software testing is an important method to ensure software quality and plays an important role in the software life cycle. How to ensure the test quality, improve the test coverage, and complete the test efficiently and with high quality are the problems that many test managers struggle with. With the increase of software scale and the increasing requirements for quality, how to achieve high-quality coverage for the software under test is an urgent problem to be solved. [0003] At present, in order to ensure the quality of software testing, test managers usually strive for sufficient testing time, ensure the execution rate of test cases, or judge the adequacy of testing according to the number of bugs (defects) based on past experience, but the above solutions have the following q...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3676
Inventor 赵霞周庆飞
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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