Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Time sequence bottleneck node analysis and time sequence optimization method and system in integrated circuit

An integrated circuit and node analysis technology, which is applied in the fields of electrical digital data processing, instruments, calculations, etc., can solve problems such as increased running time, excessive calculation, and low efficiency of critical timing paths, and achieve the goal of ensuring accuracy and improving efficiency Effect

Pending Publication Date: 2022-08-05
SHANGHAI ANLOGIC INFOTECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, exhaustively enumerating the critical timing paths in an integrated circuit is very inefficient; as the size of the chip increases, the runtime required for exhaustive methods increases exponentially
That is to say, when the scale of the chip reaches a certain level, the exhaustive method cannot be completed in a reasonable time due to the large amount of calculation.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Time sequence bottleneck node analysis and time sequence optimization method and system in integrated circuit
  • Time sequence bottleneck node analysis and time sequence optimization method and system in integrated circuit
  • Time sequence bottleneck node analysis and time sequence optimization method and system in integrated circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0043] In the following description, numerous technical details are set forth in order to provide the reader with a better understanding of the present application. However, those of ordinary skill in the art can understand that even without these technical details and various changes and modifications based on the following embodiments, the technical solutions claimed in the present application can be realized.

[0044] Explanation of some concepts:

[0045] The source and drain ends of the wire net: the wire net connects the input and output ports of the logic device in the integrated circuit, representing the transmission of a digital signal; the source and drain ends of the wire net are the input and output ports of the digital signal .

[0046] Timing constraints: In order to meet the design goals, put forward timing requirements for the integrated circuit, try to meet this requirement in the design process, and check whether the circuit meets the requirements. Generall...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an integrated circuit, discloses a time sequence bottleneck node analysis and time sequence optimization method and system in the integrated circuit, and greatly reduces the calculation amount of time sequence bottleneck analysis on the premise of ensuring the accuracy of the time sequence bottleneck analysis. The method comprises the steps of obtaining a time sequence diagram of an integrated circuit; performing forward breadth-first traversal on the time sequence diagram from the starting point of a time sequence path, and calculating the preorder time sequence criticality of each node in the time sequence diagram; performing reverse breadth-first traversal on the time sequence diagram from the end point of the time sequence path, and calculating the post-sequence time sequence criticality of each node in the time sequence diagram; for each node, calculating the product of the preorder time sequence criticality of the node and the subsequent time sequence criticality of the node as the comprehensive time sequence criticality of the node; and determining a time sequence bottleneck node according to the comprehensive time sequence criticality of each node.

Description

technical field [0001] The present application relates to integrated circuits, and in particular to timing optimization techniques for integrated circuits. Background technique [0002] This section is intended to provide a background or context for the embodiments of the application that are recited in the claims. The description herein is not an admission that it is disclosed prior art by inclusion in this section. [0003] Timing is a critical element of integrated circuits (also known as chips). The integrated circuit that meets the timing requirements can work normally, and the timing also determines the operating frequency of the integrated circuit, and the operating frequency is a decisive factor in the performance of the integrated circuit. [0004] Through a comprehensive analysis of the integrated circuit, the timing bottleneck of the integrated circuit is identified, and then timing optimization is performed for the timing bottleneck, which can effectively impro...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F30/3315G06F30/337
CPCG06F30/3315G06F30/337
Inventor 王钦克
Owner SHANGHAI ANLOGIC INFOTECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products