AFM-based data storage and microscope

Abstract

Read / write components for AFM-based data storage devices are provided. In a particular embodiment, the read / write unit (30, 45, 50, 65, 80) comprises a lever arrangement (31, 51, 66, 82) and a support structure (32, 52, 67, 81), the lever arrangement being connected to the supporting structure for substantially pivotal movement. Lever means (31, 51, 66, 82) provide first and second current paths between a pair of power supply lines (R, C) on the support structure, when in use, the lever means can be connected to the Power supply for write mode and read mode operation. A write mode heater (36, 47, 56, 73) is provided on the lever arrangement and in the first current path, a read / write probe (37, 57, 74, 84) is provided on the write mode heater. Read mode heaters (39, 46, 58, 75, 83) are provided on the lever arrangement and are located in the second current path. In use, the decoupling means (38a, 38b, 40a, 40b, 60, 61, 77a, 77b, 78a, 78b) are used to inhibit current flow through the first current path to the write mode heating when the power supply is operating in the read mode device. Components with separate write and read mode heaters can then be addressed in read and write mode by a single pair of supply lines. Other embodiments provide a read / write unit (100) using a thermal decoupling mechanism and a read / write unit (80), wherein read detection is performed by a proximity detection structure between a lever arrangement and a support structure. A detection device (115) for an atomic force microscope is also provided, wherein probe motion can be detected by a similar proximity detection structure.

Description

technical field [0001] The present invention relates to AFM (Atomic Force Microscopy) based data storage and microscope systems. Particular embodiments of the present invention provide read / write means for data storage devices and detection means for atomic force microscopes. Background technique [0002] Atomic force microscopy is now a well-known device in which the topography of a sample is probed by a probe mounted at the end of a microcantilever. As the sample is scanned, the atomic force interaction between the nanometer-sensitive probe and the sample surface causes the pivot of the cantilever to deflect. By detecting this deflection, the sample topography is determined. AFM technology is also being applied in the field of data storage in order to provide a new generation of high-density high data rate data storage devices for mass memory applications. AFM-based Data Storage, which is incorporated herein by reference. Here, a probe mounted on a cantilever is used ...

AI Technical Summary

Problems solved by technology

However, heater platform design must compromise between write requirements and read requirements in individual parts, and this limits operating efficiency in both write and read modes

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