Bit line controlling decoder circuit, semiconductor storage device and data device and data reading method thereof
A semiconductor and bit line technology, applied in the field of data readout, which can solve problems such as misreading and leakage current prevention
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[0101] Hereinafter, the present invention will be described in detail based on the embodiments shown in the drawings.
[0102] figure 1 The structure of a memory array of a virtual ground type nonvolatile semiconductor storage device of one embodiment is shown. The memory array is a virtual ground type, and the figure shows one of the blocks of the memory array. ACT (Asymmetric Contactless Transistor) cells are called memory cells.
[0103]The work of the ACT unit is as follows. It should be noted that the FT (Fowler-Nordheim) tunneling effect is used for writing and erasing. First, the read and verify operations will be described. Read and verify operations are performed in the same way. During reading, such as Figure 9A As shown, the read voltage (verification voltage) is applied to the write line WL of the transistor constituting each memory cell, and a voltage of 1 volt is applied to the source side sub-bit line SB. Then, the sense amplifier performs sense amplification to ...
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