Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Large-scale three dimensional shape and appearance measuring and splicing method without being based on adhesive mark

A shape measurement and marking technology, which is applied in the field of precision measurement, can solve the problems of destroying the characteristics of the measured shape itself, increasing the error of automatic recognition, and affecting the authenticity of the measurement, so as to achieve true and reliable measurement data, deceleration errors, and high efficiency. Effect

Inactive Publication Date: 2005-04-13
TIANJIN UNIV
View PDF0 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The above method has obvious limitations: 1) For the appearance measurement of large objects, many marking points must be set, which is very cumbersome, and as the number of marking points increases, the error of automatic recognition increases; 2) A large number of marking points must be pasted on the measured object surface, which destroys the characteristics of the measured shape and affects the authenticity of the measurement

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Large-scale three dimensional shape and appearance measuring and splicing method without being based on adhesive mark
  • Large-scale three dimensional shape and appearance measuring and splicing method without being based on adhesive mark
  • Large-scale three dimensional shape and appearance measuring and splicing method without being based on adhesive mark

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach

[0022] Such as figure 2 As shown, more than 4 global control points are placed in the measured space. The number of global points can be determined according to the actual requirements (the size of the measured object). The global control points are positioned at the center of the precision sphere. Three (or more) probe control points are fixed on the optical probe, and the probe control points are positioned by the center of a precision sphere or the center of a plane circle. The coordinates of the control points on the probe in the probe measurement coordinate system are pre-calibrated.

[0023] When measuring, first, use a digital camera to take images containing all global control points from multiple angles, and obtain the global control points in the global coordinate system O g x g Y g Z g The spatial coordinate value in ; secondly, the optical probe measures each area of ​​the measured object one by one, and when measuring each area S i when, such as image 3, u...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The large 3D body appearance measuring and splicing method without adhered mark converts the local position measuring data of local measuring head data with the measuring head controlling points to the global coordinates to realize splicing. The splicing process includes the following steps: setting in the measurement space one reference ruler with two mark points; obtaining images of the global marks and reference ruler in different posture with high resolution digital camera from different directions; photographing one image frame with the measuring head controlling point and at least 3 global control points; converting the measuring head measured data of all areas to the global coordinate system, etc. to complete the splicing of single area measuring data to the integral. No marks adhered to the measured body has no influence on the self characteristic of the measured appearance, true and reliable measurement data and high operation efficiency.

Description

technical field [0001] The invention relates to a precision measurement method, in particular to a splicing method for measuring the shape of a large object (body) not based on sticky marking points. Background technique [0002] Body shape measurement refers to the measurement of the surface shape of the body. It is the basic support technology for modern reverse engineering and product digital design, management and manufacturing. It is also an advanced product testing method. It has a wide range of application backgrounds in the field of advanced manufacturing. has drawn people's attention. [0003] Traditionally, there are two main types of schemes for realizing shape measurement: direct use of coordinate measuring machine (CMM) and indirect use of CMM measurement principles. The former directly applies the CMM, puts the object to be measured on the CMM, samples the object with the CMM probe, and obtains the shape data of the object. However, due to the limitation of th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/03G01B11/24G01B21/04G01B21/20
Inventor 邾继贵吴斌刘常杰
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com