Detection for reducing soft error of hardware

A technology with errors and subtraction, which is applied to the redundancy in the calculation for data error detection, response error generation, etc., can solve the problems of large silicon cost and low cost performance

Inactive Publication Date: 2005-04-27
INTEL CORP
View PDF0 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In contrast, in most known systems, the detection of soft errors in combinational logic elements typically involves relatively expensive redundant hardware schemes
The downside of this approach is that providing sufficient hardware redundancy to detect soft errors in combinational logic is usually not cost-effective due to the considerable silicon cost of the redundant hardware

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Detection for reducing soft error of hardware
  • Detection for reducing soft error of hardware
  • Detection for reducing soft error of hardware

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The following discussion sets forth numerous specific details in order to provide a thorough understanding of the invention. However, one of ordinary skill in the art having the benefit of this disclosure will recognize that the present invention may be practiced without these specific details. Also, various well-known methods, procedures, components and circuits have not been described in detail in order to focus attention on the characteristics of the present invention.

[0019] The hardware-reduced soft error detection embodiments discussed herein can be used with both signed and unsigned integer representations. Although much of the discussion below focuses on signed integers by way of example, those skilled in the art will recognize that signed integer representations may be used in conjunction with the soft error detection embodiments described herein, or unsigned integer representations may also be used. Integer representation.

[0020] As far as signed integer...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The soft error detection method and system for integral number addition and subtraction operation without adopting redundance logic is provided. For integral number addition and subtraction, the compensation logic generates the compensation value with the ALU result and operand. The compensation value is verified with the verification logic corresponding to the preset value to judge whether to have soft error. Under the hardware condition of carry transfer and no redundance, the compensation logic and the verification logic operate on the integral operand and the result ALU generates.

Description

technical field [0001] The present invention relates to systems for processing data, and more particularly to systems for detecting soft errors during execution in a computing environment. Background technique [0002] The phenomenon of soft errors is of increasing concern to processor designers. Soft errors are intermittent errors that occur during processor execution and are caused by alpha particles or high-energy neutrons in the atmosphere striking active regions of silicon, and are not due to design or manufacturing flaws . Soft errors alter the stored charge in memory cells and logic while leaving the physical circuit intact, producing incorrect behavior and results. Therefore, soft errors, also known as transient faults or single-event upsets (SEUs), result in an invalid state. [0003] Two sources of soft errors are high-energy neutrons and alpha particles. High-energy neutrons are the result of collisions between cosmic rays and atmospheric particles. Alpha par...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/14
Inventor S·马基内尼G·B·多施
Owner INTEL CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap