Method and apparatus for testing and sorting join arrangement electronic devices

A technology of electronic devices and sorting devices, which is applied in sorting and other directions, can solve problems such as low efficiency and unguaranteed quality, and achieve the effects of simple adjustment, avoiding accidental interference, and accurate fault judgment

Inactive Publication Date: 2005-09-21
南京熊猫仪器仪表有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the test method for this kind of device is mainly to use fixtures to test and select manually. This method is inefficient and the quality cannot be guaranteed.

Method used

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  • Method and apparatus for testing and sorting join arrangement electronic devices
  • Method and apparatus for testing and sorting join arrangement electronic devices
  • Method and apparatus for testing and sorting join arrangement electronic devices

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0021] The system includes: automatic feeding mechanism, feeding mechanism, cutting mechanism, testing mechanism, sorting mechanism and control system. A row of devices to be tested is placed in a row in the same direction on the feeding tray of the automatic feeding mechanism. A photoelectric sensor is installed on the automatic feeding mechanism. When it is sensed that the current row of devices has been aligned with the entrance of the feeding track , the feeding propulsion device moves to push the row of devices to an appropriate position in the feeding track. After the photoelectric sensor on the feeding track detects that the row of devices has reached the correct position, the feeding propulsion device returns, and the thimble is pushed out at the same time. Drive the row of devices to move forward one hole position, and the thimble of the material is retracted and returned to the initial position, and then pushed out to drive the row of devices to move forward one hole ...

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PUM

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Abstract

The invention relates to method for testing and sorting the gang electronic device, which comprises the following steps: a) step-by-step driving the electronic device according to the space between two devices in sequence, b) transporting to the pre-cutting station, keeping one pin on the connecting plate and cutting off the other, c) transporting to the testing station to test, driving the testing box through the adjustable apparatus, connecting the tested electric pole with the pin to get the apparatus parameter, d) cutting the scoring pin in the final-cutting station, then transporting to the baiting sorting device. The invention has high precision of gearing and high automation, uses several photoelectric sensors and overtravel-limit switches to test, which can pinpoint exactly and judge the fault precisely, and increase the sorting speed violently.

Description

1. Technical field [0001] The invention relates to a method and device for testing and sorting electronic devices with lead pins, in particular to a method and device for testing and sorting ceramic electronic components with two or more lead pins and related devices. 2. Background technology [0002] Ceramic electronic components with lead pins and related devices, such as: capacitors, inductors, diodes, triodes, voltage regulators, resonators, filters, traps and other discrete devices are currently the most used electronic devices, especially It is a row-type ceramic resonator, filter and related devices. The method and device for testing and sorting serial ceramic resonators, filters and related electronic devices that the applicant has applied for is used to detect and sort electronic devices made and packaged from ceramic chips, such as resonators and filters. select. Since ceramic resonators, filters and related devices with pins have polarity or have certain require...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/344
Inventor 陈晓争黄义张轶
Owner 南京熊猫仪器仪表有限公司
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